Louay Abdallah

According to our database, Louay Abdallah authored at least 16 papers between 2010 and 2018.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2018

Dynamic Analog/RF Alternate Test Strategies Based on On-chip Learning.

Parth Kansara, Sharanabasavaraja Bheema Reddy, Louay Abdallah, Ke Huang

J. Electron. Test., 2018

2015

Test and Calibration of RF Circuits Using Built-in Non-intrusive Sensors.

Athanasios Dimakos, Martin Andraud, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Emmanuel Simeu, Salvador Mir

Proceedings of the 2015 IEEE Computer Society Annual Symposium on VLSI, 2015

Fast deployment of alternate analog test using Bayesian model fusion.

John Liaperdos, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Yiorgos Tsiatouhas, Angela Arapoyanni, Xin Li

Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015

2014

Review of temperature sensors as monitors for RF-MMW built-in testing and self-calibration schemes.

Josep Altet, Eduardo Aldrete-Vidrio, Ferran Reverter, Didac Gómez, José Luis González, Marvin Onabajo, José Silva-Martínez, B. Martineau, X. Perpiñà, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Xavier Aragonès, Xavier Jordà, Miquel Vellvehí, Stefan Dilhaire, Salvador Mir, Diego Mateo

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

Low-cost EVM built-in test of RF transceivers.

Ayssar Serhan, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir

Proceedings of the 9th International Design and Test Symposium, 2014

2013

Defect-oriented non-intrusive RF test using on-chip temperature sensors.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

True non-intrusive sensors for RF built-in test.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir

Proceedings of the 2013 IEEE International Test Conference, 2013

Multivariate statistical techniques for analog parametric test metrics estimation.

Ke Huang, Haralampos-G. D. Stratigopoulos, Louay Abdallah, Salvador Mir, Ahcène Bounceur

Proceedings of the 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2013

2012

Experiences with non-intrusive sensors for RF built-in test.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma

Proceedings of the 2012 IEEE International Test Conference, 2012

Accurate estimation of analog test metrics with extreme circuits.

Kamel Beznia, Ahcène Bounceur, Louay Abdallah, Ke Huang, Salvador Mir, Reinhardt Euler

Proceedings of the 19th IEEE International Conference on Electronics, Circuits and Systems, 2012

Testing RF circuits with true non-intrusive built-in sensors.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Josep Altet

Proceedings of the 2012 Design, Automation & Test in Europe Conference & Exhibition, 2012

2011

RF Front-End Test Using Built-in Sensors.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir, Christophe Kelma

IEEE Des. Test Comput., 2011

Implicit test of high-speed analog circuits using non-intrusive sensors.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir

Proceedings of the 20th European Conference on Circuit Theory and Design, 2011

On Replacing an RF Test with an Alternative Measurement: Theory and a Case Study.

Alexios Spyronasios, Louay Abdallah, Haralampos-G. D. Stratigopoulos, Salvador Mir

Proceedings of the 20th IEEE Asian Test Symposium, 2011

2010

Adaptive logical control of RF LNA performances for efficient energy consumption.

Rafik Khereddine, Louay Abdallah, Emmanuel Simeu, Salvador Mir, Fabio Cenni

Proceedings of the 18th IEEE/IFIP VLSI-SoC 2010, 2010

Sensors for built-in alternate RF test.

Louay Abdallah, Haralampos-G. D. Stratigopoulos, Christophe Kelma, Salvador Mir

Proceedings of the 15th European Test Symposium, 2010