Loïc Welter

According to our database, Loïc Welter authored at least 7 papers between 2013 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Notched gate MOSFET for capacitance reduction in RF SOI technology.

Lucas Antunes Tambara, Pascal Masson, Julien Amouroux, Stéphane Monfray, Julien Dura, Frederic Gianesello, Julien Babic, Romain Debroucke, Loic Welter, Siddhartha Dhar, Bernadette Gros, Clement Charbuillet, Franck Julien, Guillaume Bertrand, Arnaud Régnier, Alain Fleury

Proceedings of the 2023 IEEE International Conference on Design, 2023

2015

Improvement of MOSFET matching characterization with calibrated multiplexed test structure.

Loic Welter, J. L. Scotto di Quaquero, Philippe Dreux, Laurent Lopez, Hassen Aziza, Jean-Michel Portal

Microelectron. Reliab., 2015

Dynamic current reduction of CMOS digital circuits through design and process optimization.

Jordan Innocenti, Loïc Welter, Nicolas Borrel, Franck Julien, Jean-Michel Portal, Jacques Sonzogni, Laurent Lopez, Pascal Masson, Stephan Niel, Philippe Dreux, Julia Castellan

Proceedings of the 25th International Workshop on Power and Timing Modeling, 2015

2014

Dynamic power reduction through process and design optimizations on CMOS 80 nm embedded non-volatile memories technology.

Jordan Innocenti, Loic Welter, Franck Julien, Laurent Lopez, Jacques Sonzogni, Stephan Niel, Arnaud Régnier, Emmanuel Paire, Karen Labory, Eric Denis, Jean-Michel Portal, Pascal Masson

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

An innovative standard cells remapping method for in-circuit critical parameters monitoring.

Loic Welter, Philippe Dreux, Hassen Aziza, Jean-Michel Portal

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

Accurate multiplexed test structure for threshold voltage matching evaluation.

Loic Welter, Philippe Dreux, Jordan Innocenti, Hassen Aziza, Jean-Michel Portal

Proceedings of the 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2014

2013

Embedded high-precision frequency-based capacitor measurement system.

Loic Welter, Philippe Dreux, Jean-Michel Portal, Hassen Aziza

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013