Lloyd W. Massengill

According to our database, Lloyd W. Massengill authored at least 13 papers between 1989 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

Frequency, LET, and Supply Voltage Dependence of Logic Soft Errors at the 7-nm Node.

Yoni Xiong, Alexandra Feeley, Lloyd W. Massengill, Bharat L. Bhuva, Shi-Jie Wen, Rita Fung

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Temperature Dependence of Single-Event Transient Pulse Widths for 7-nm Bulk FinFET Technology.

Jingchen Cao, Lyuan Xu, Shi-Jie Wen, Rita Fung, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020

2019

Single-Event Upset Responses of Dual- and Triple-Well D Flip-Flop Designs in 7-nm Bulk FinFET Technology.

Lyuan Xu, Jingchen Cao, Bharat L. Bhuva, Indranil Chatterjee, Shi-Jie Wen, Richard Wong, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

Alpha Particle Soft-Error Rates for D-FF Designs in 16-Nm and 7-Nm Bulk FinFET Technologies.

Jingchen Cao, Lyuan Xu, Bharat L. Bhuva, Shi-Jie Wen, Richard Wong, Balaji Narasimham, Lloyd W. Massengill

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Evaluation on flip-flop physical unclonable functions in a 14/16-nm bulk FinFET technology.

H. Zhang, H. Jiang, M. R. Eaker, Kurt J. Lezon, Balaji Narasimham, Nihaar N. Mahatme, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Designing soft-error-aware circuits with power and speed optimization.

H. Jiang, H. Zhang, Balaji Narasimham, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

Impact of supply voltage and particle LET on the soft error rate of logic circuits.

Hui Jiang, H. Zhang, R. C. Harrington, J. A. Maharrey, J. S. Kauppila, Lloyd W. Massengill, Bharat L. Bhuva

Proceedings of the IEEE International Reliability Physics Symposium, 2018

2015

Multi-cell soft errors at the 16-nm FinFET technology node.

N. Tam, Bharat L. Bhuva, Lloyd W. Massengill, Dennis R. Ball, Michael W. McCurdy, Michael L. Alles, Indranil Chatterjee

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2011

The sensitivity of radiation-induced leakage to STI topology and sidewall doping.

Nadia Rezzak, Michael L. Alles, Ronald D. Schrimpf, Sarah Kalemeris, Lloyd W. Massengill, John Sochacki, Hugh J. Barnaby

Microelectron. Reliab., 2011

2008

Design Technique for Mitigation of Soft Errors in Differential Switched-Capacitor Circuits.

Patrick R. Fleming, Brian D. Olson, W. Timothy Holman, Bharat L. Bhuva, Lloyd W. Massengill

IEEE Trans. Circuits Syst. II Express Briefs, 2008

1992

An analog neural hardware implementation using charge-injection multipliers and neutron-specific gain control.

Lloyd W. Massengill, David Bryan Mundie

IEEE Trans. Neural Networks, 1992

1991

Weight decay and resolution effects in feedforward artificial neural networks.

David Bryan Mundie, Lloyd W. Massengill

IEEE Trans. Neural Networks, 1991

1989

RSIM: A circuit simulation program for VLSI interconnect networks.

Lloyd W. Massengill, Neal Bengtson

Simul., 1989