Lloyd Burrell

According to our database, Lloyd Burrell authored at least 2 papers between 2018 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

A Comprehensive Wafer Level Reliability Study on 65nm Silicon Interposer.

C. S. Premachandran, Thuy Tran-Quinn, Lloyd Burrell, Patrick Justison

Proceedings of the IEEE International Reliability Physics Symposium, 2019

2018

Reliability challenges for 2.5D/3D integration: An overview.

C. S. Premachandran, Seungman Choi, Salvatore Cimino, Thuy Tran-Quinn, Lloyd Burrell, Patrick Justison

Proceedings of the IEEE International Reliability Physics Symposium, 2018