Lionel Trojman

According to our database, Lionel Trojman authored at least 23 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Natural Language Processing for Arabic Sentiment Analysis: A Systematic Literature Review.

Souha Al Katat, Chamseddine Zaki, Hussein Hazimeh, Ibrahim El Bitar, Rafael Angarita, Lionel Trojman

IEEE Trans. Big Data, October, 2024

All-GaN Integrated Overcurrent Protection Circuit Using Only Enhancement-mode p-GaN Devices.

Nataly Pozo, Luis-Miguel Prócel, Lionel Trojman

Proceedings of the 37th SBC/SBMicro/IEEE Symposium on Integrated Circuits and Systems Design, 2024

Design of a Gate Driver Based-on E-mode p-GaN HEMTs Handling 650V/10A GaN Power Device.

Nataly Pozo, Luis-Miguel Prócel, Lionel Trojman

Proceedings of the 22nd IEEE Interregional NEWCAS Conference, 2024

2023

Efficiency of Double-Barrier Magnetic Tunnel Junction-Based Digital eNVM Array for Neuro-Inspired Computing.

Tatiana Moposita, Esteban Garzón, Felice Crupi, Lionel Trojman, Andrei Vladimirescu, Marco Lanuzza

IEEE Trans. Circuits Syst. II Express Briefs, March, 2023

SIMPLY+: A Reliable STT-MRAM-Based Smart Material Implication Architecture for In-Memory Computing.

Tatiana Moposita, Esteban Garzón, Raffaele De Rose, Felice Crupi, Andrei Vladimirescu, Lionel Trojman, Marco Lanuzza

IEEE Access, 2023

Enhancement-mode p-GaN Comparators for power applications.

Nataly Pozo, Luis-Miguel Prócel, Lionel Trojman

Proceedings of the 18th Conference on Ph.D Research in Microelectronics and Electronics, 2023

Analysis and Design of a Self-Powered VEH System Based on ULP Comparator.

Eduardo Holguin, Luis-Miguel Prócel, Alexis Brenes, Andrei Vladimirescu, Lionel Trojman

Proceedings of the 14th IEEE Latin America Symposium on Circuits and System, 2023

2022

Adjusting Thermal Stability in Double-Barrier MTJ for Energy Improvement in Cryogenic STT-MRAMs.

Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Adam Teman, Marco Lanuzza

CoRR, 2022

Design and optimization of a Vibrational MEMS-Based Energy Harvester.

Eduardo Holguin, Lionel Trojman, Luis-Miguel Procel, Alexis Brenes, Andrei Vladimirescu

Proceedings of the 17th Conference on Ph.D Research in Microelectronics and Electronics, 2022

DMTJ-Based Non-Volatile Ternary Content Addressable Memory for Energy-Efficient High-Performance Systems.

Kevin Vicuña, Luis-Miguel Prócel, Lionel Trojman, Ramiro Taco

Proceedings of the 13th IEEE Latin America Symposium on Circuits and System, 2022

Energy-Efficient FinFET-Versus TFET-Based STT-MRAM Bitcells.

Ariana Musello, Santiago S. Pérez, Marco Villegas, Luis-Miguel Prócel, Ramiro Taco, Lionel Trojman

Proceedings of the 13th IEEE Latin America Symposium on Circuits and System, 2022

Voltage-to-Voltage Sigmoid Neuron Activation Function Design for Artificial Neural Networks.

Tatiana Moposita, Lionel Trojman, Felice Crupi, Marco Lanuzza, Andrei Vladimirescu

Proceedings of the 13th IEEE Latin America Symposium on Circuits and System, 2022

Voltage and Technology Scaling of DMTJ-based STT-MRAMs for Energy-Efficient Embedded Memories.

Esteban Garzón, Ramiro Taco, Luis-Miguel Prócel, Lionel Trojman, Marco Lanuzza

Proceedings of the 13th IEEE Latin America Symposium on Circuits and System, 2022

2021

RF-DC Multiplier for RF Energy Harvester based on 32nm and TFET technologies.

Lionel Trojman, David Rivadeneira, Marco Villegas, Eliana Acurio, Marco Lanuzza, Luis-Miguel Procel, Ramiro Taco

Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

High-Speed and Low-Energy Dual-Mode Logic based Single-Clack-Cycle Binary Comparator.

Ricardo Escobar, Luis-Miguel Prócel, Lionel Trojman, Marco Lanuzza, Ramiro Taco

Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021

ON-state reliability of GaN-on-Si Schottky Barrier Diodes: Si3N4 vs. Al2O3/SiO2 GET dielectric.

Eliana Acurio, Lionel Trojman, Brice De Jaeger, Benoit Bakeroot, Stefaan Decoutere

Proceedings of the IEEE International Reliability Physics Symposium, 2021

2020

Assessment of STT-MRAMs based on double-barrier MTJs for cache applications by means of a device-to-system level simulation framework.

Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza

Integr., 2020

Optimization of Active Voltage Rectifier / Doubler Designed in 90 nm Technology.

David Rivadeneira, Marco Villegas, Luis-Miguel Procel, Lionel Trojman

Proceedings of the 11th IEEE Latin American Symposium on Circuits & Systems, 2020

Reconfigurable CMOS/STT-MTJ Non-Volatile Circuit for Logic-in-Memory Applications.

Esteban Garzón, Benjamin Zambrano, Tatiana Moposita, Ramiro Taco, Luis-Miguel Prócel, Lionel Trojman

Proceedings of the 11th IEEE Latin American Symposium on Circuits & Systems, 2020

2019

Exploiting Double-Barrier MTJs for Energy-Efficient Nanoscaled STT-MRAMs.

Esteban Garzón, Raffaele De Rose, Felice Crupi, Lionel Trojman, Giovanni Finocchio, Mario Carpentieri, Marco Lanuzza

Proceedings of the 16th International Conference on Synthesis, 2019

New insight for next generation SRAM: tunnel FET versus FinFET for different topologies.

Adriana Arevalo, Romain Liautard, Daniel Romero, Lionel Trojman, Luis-Miguel Procel

Proceedings of the 32nd Symposium on Integrated Circuits and Systems Design, 2019

Microprocessor Design with a Direct Bluetooth Connection in 45 nm Technology Using Microwind.

Esteban Garzón, Felix Chavez, Diego Jaramillo, Luis Sanchez, Sofia Lara, Carlos Macias, Eliana Acurio, Luis-Miguel Procel, Lionel Trojman, Etienne Sicard

Proceedings of the 10th IEEE Latin American Symposium on Circuits & Systems, 2019

2015

Origins and implications of increased channel hot carrier variability in nFinFETs.

Ben Kaczer, Jacopo Franco, M. Cho, Tibor Grasser, Philippe J. Roussel, Stanislav Tyaginov, M. Bina, Yannick Wimmer, Luis-Miguel Procel, Lionel Trojman, Felice Crupi, Gregory Pitner, Vamsi Putcha, Pieter Weckx, Erik Bury, Z. Ji, An De Keersgieter, Thomas Chiarella, Naoto Horiguchi, Guido Groeseneken, Aaron Thean

Proceedings of the IEEE International Reliability Physics Symposium, 2015