Lichao Zeng

According to our database, Lichao Zeng authored at least 2 papers between 2024 and 2025.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of five.

2025

DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.

Lichao Zeng, Zhouzhouzhou Mei, Zhongyu Shi, Yining Chen

Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025

2024

Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation.

Yibo Qiao, Weiping Xie, Shunyuan Lou, Qian Jin, Lichao Zeng, Yining Chen, Qi Sun, Cheng Zhuo

Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024