Lichao Zeng
Orcid: 0009-0003-6614-0049
According to our database1,
Lichao Zeng
authored at least 2 papers
between 2024 and 2025.
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Bibliography
2025
DefectTrackNet: Efficient Root Cause Analysis of Wafer Defects in Semiconductor Manufacturing Using a Lightweight CNN-Transformer Architecture.
Proceedings of the 30th Asia and South Pacific Design Automation Conference, 2025
2024
Minimizing Labeling, Maximizing Performance: A Novel Approach to Nanoscale Scanning Electron Microscope (SEM) Defect Segmentation.
Proceedings of the 61st ACM/IEEE Design Automation Conference, 2024