Li-Yi Xiao
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Bibliography
2019
Susceptibility Evaluation of 3D Integrated Static Random Access Memory with Through-Silicon Vias (TSVs).
Proceedings of the International Conference on IC Design and Technology, 2019
Proceedings of the 13th IEEE International Conference on ASIC, 2019
A Method to Design 5-Bit Burst Error Correction Code against the Multiple Bit Upset (MBU) in Memories.
Proceedings of the 13th IEEE International Conference on ASIC, 2019