Li-Chang Chao

According to our database1, Li-Chang Chao authored at least 2 papers between 2008 and 2009.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

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PhD thesis 
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Links

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Bibliography

2009
Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index.
Expert Syst. Appl., 2009

2008
Novel yield model for integrated circuits with clustered defects.
Expert Syst. Appl., 2008


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