Li-C. Wang

According to our database, Li-C. Wang authored at least 187 papers between 1991 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

Oracle-Checker Scheme for Evaluating a Generative Large Language Model.

Yueling Jenny Zeng, Li-C. Wang, Thomas Ibbetson

CoRR, 2024

LLM-Assisted Analytics in Semiconductor Test (Invited).

Li-C. Wang

Proceedings of the 2024 ACM/IEEE International Symposium on Machine Learning for CAD, 2024

WM-Graph: Graph-Based Approach for Wafermap Analytics.

Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2024

2023

Domain Knowledge Graph Construction Via A Simple Checker.

Yueling Zeng, Li-C. Wang

CoRR, 2023

Welcome Message ITC 2023.

Li-C. Wang, Jeff Rearick

Proceedings of the IEEE International Test Conference, 2023

IEA-Plot: Conducting Wafer-Based Data Analytics Through Chat.

Matthew Dupree, Min Jian Yang, Yueling Jenny Zeng, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2023

2022

Language Driven Analytics for Failure Pattern Feedforward and Feedback.

Min Jian Yang, Yueling Zeng, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2022

Wafer Map Pattern Analytics Driven By Natural Language Queries.

Yueling Jenny Zeng, Min Jian Yang, Li-C. Wang

Proceedings of the IEEE International Test Conference in Asia, 2022

2021

MINiature Interactive Offset Networks (MINIONs) for Wafer Map Classification.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan

Proceedings of the IEEE International Test Conference, 2021

2020

Learning A Wafer Feature With One Training Sample.

Yueling Jenny Zeng, Li-C. Wang, Chuanhe Jay Shan, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2020

2019

Wafer Pattern Recognition Using Tucker Decomposition.

Ahmed Wahba, Li-C. Wang, Zheng Zhang, Nik Sumikawa

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Primitive Concept Identification In A Given Set Of Wafer Maps.

Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the International Symposium on VLSI Design, Automation and Test, 2019

Deploying A Machine Learning Solution As A Surrogate.

Chuanhe Jay Shan, Ahmed Wahba, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2019

Wafer Plot Classification Using Neural Networks and Tensor Methods.

Ahmed Wahba, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference in Asia, 2019

Facilitating Deployment Of A Wafer-Based Analytic Software Using Tensor Methods: Invited Paper.

Li-C. Wang, Chuanhe Jay Shan, Ahmed Wahba

Proceedings of the International Conference on Computer-Aided Design, 2019

2018

Discovering Interesting Plots in Production Yield Data Analytics.

Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

CoRR, 2018

A Concept Learning Tool Based On Calculating Version Space Cardinality.

Kuo-Kai Hsieh, Li-C. Wang

CoRR, 2018

Special session on machine learning for test and diagnosis.

Krishnendu Chakrabarty, Li-C. Wang, Gaurav Veda, Yu Huang

Proceedings of the 36th IEEE VLSI Test Symposium, 2018

An Autonomous System View To Apply Machine Learning.

Li-C. Wang

Proceedings of the IEEE International Test Conference, 2018

Concept Recognition in Production Yield Data Analytics.

Matthew Nero, Chuanhe Jay Shan, Li-C. Wang, Nik Sumikawa

Proceedings of the IEEE International Test Conference, 2018

Machine Learning for Feature-Based Analytics.

Li-C. Wang

Proceedings of the 2018 International Symposium on Physical Design, 2018

2017

Experience of Data Analytics in EDA and Test - Principles, Promises, and Challenges.

Li-C. Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Challenges and Trends in Modern SoC Design Verification.

Wen Chen, Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang

IEEE Des. Test, 2017

Data-Driven Test Plan Augmentation for Platform Verification.

Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra

IEEE Des. Test, 2017

Guest Editors' Introduction: Emerging Challenges and Solutions in SoC Verification.

Magdy S. Abadir, Jayanta Bhadra, Wen Chen, Li-C. Wang

IEEE Des. Test, 2017

Learning the process for correlation analysis.

Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Dynamic Exerciser Template Weighting in x86 Processor Verification.

Ahmed Wahba, Justin Hohnerlein, Farhan Rahman, Li-C. Wang

Proceedings of the 18th International Workshop on Microprocessor and SOC Test and Verification, 2017

Some considerations on choosing an outlier method for automotive product lines.

Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg

Proceedings of the IEEE International Test Conference, 2017

Kernel based clustering for quality improvement and excursion detection.

Nik Sumikawa, Matt Nero, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2017

Systematic defect detection methodology for volume diagnosis: A data mining perspective.

Chuanhe Jay Shan, Pietro Babighian, Yan Pan, John M. Carulli, Li-C. Wang

Proceedings of the IEEE International Test Conference, 2017

Learning to Produce Direct Tests for Security Verification Using Constrained Process Discovery.

Kuo-Kai Hsieh, Li-C. Wang, Wen Chen, Jayanta Bhadra

Proceedings of the 54th Annual Design Automation Conference, 2017

Feature extraction from design documents to enable rule learning for improving assertion coverage.

Kuo-Kai Hsieh, Sebastian Siatkowski, Li-C. Wang, Wen Chen, Jayanta Bhadra

Proceedings of the 22nd Asia and South Pacific Design Automation Conference, 2017

2016

ITC and the Future of Test - We've Won.

Ron Press, Li-C. Wang

IEEE Des. Test, 2016

Consistency in wafer based outlier screening.

Sebastian Siatkowski, Chuanhe Jay Shan, Li-C. Wang, Nikolas Sumikawa, W. Robert Daasch, John M. Carulli

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Session 4B - Panel data analytics in semiconductor manufacturing.

Suriyaprakash Natarajan, Li-C. Wang

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

2015

Generalization of an outlier model into a "global" perspective.

Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch

Proceedings of the 2015 IEEE International Test Conference, 2015

Machine Learning in Simulation-Based Analysis.

Li-C. Wang, Malgorzata Marek-Sadowska

Proceedings of the 2015 Symposium on International Symposium on Physical Design, ISPD 2015, Monterey, CA, USA, March 29, 2015

Data mining in functional test content optimization.

Li-C. Wang

Proceedings of the 20th Asia and South Pacific Design Automation Conference, 2015

2014

Design trends and test challenges in automotive electronics.

Li-C. Wang

Proceedings of the Technical Papers of 2014 International Symposium on VLSI Design, 2014

Yield optimization using advanced statistical correlation methods.

Jeff Tikkanen, Sebastian Siatkowski, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2014 International Test Conference, 2014

Multivariate outlier modeling for capturing customer returns - How simple it can be.

Jeff Tikkanen, Nik Sumikawa, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2014 IEEE 20th International On-Line Testing Symposium, 2014

On application of data mining in functional debug.

Kuo-Kai Hsieh, Wen Chen, Li-C. Wang, Jayanta Bhadra

Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2014

Data Mining In EDA - Basic Principles, Promises, and Constraints.

Li-C. Wang, Magdy S. Abadir

Proceedings of the 51st Annual Design Automation Conference 2014, 2014

2013

Guest Editorial: Test and Verification Challenges for Future Microprocessors and SoC Designs.

Sandip Ray, Jay Bhadra, Magdy S. Abadir, Li-C. Wang

J. Electron. Test., 2013

Novel test analysis to improve structural coverage - A commercial experiment.

Wen Chen, Li-C. Wang, Jayanta Bhadra, Magdy S. Abadir

Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013

Analyzing Efficacy of Constrained Test Program Generators - A Case Study.

Vinayak Kamath, Farhan Rahman, Li-C. Wang

Proceedings of the 14th International Workshop on Microprocessor Test and Verification, 2013

A pattern mining framework for inter-wafer abnormality analysis.

Nik Sumikawa, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2013 IEEE International Test Conference, 2013

Data mining in design and test processes: basic principles and promises.

Li-C. Wang

Proceedings of the International Symposium on Physical Design, 2013

Simulation knowledge extraction and reuse in constrained random processor verification.

Wen Chen, Li-C. Wang, Jay Bhadra, Magdy S. Abadir

Proceedings of the 50th Annual Design Automation Conference 2013, 2013

2012

Introduction to special section on verification challenges in the concurrent world.

Sandip Ray, Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Aarti Gupta

ACM Trans. Design Autom. Electr. Syst., 2012

Foreword.

An-Yeu Wu, Li-C. Wang

Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

Data mining based prediction paradigm and its applications in design automation.

Magdy S. Abadir, Nik Sumikawa, Wen Chen, Li-C. Wang

Proceedings of Technical Program of 2012 VLSI Design, Automation and Test, 2012

An experiment of burn-in time reduction based on parametric test analysis.

Nik Sumikawa, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2012 IEEE International Test Conference, 2012

Screening customer returns with multivariate test analysis.

Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 2012 IEEE International Test Conference, 2012

Functional test content optimization for peak-power validation - An experimental study.

Vinayak Kamath, Wen Chen, Nik Sumikawa, Li-C. Wang

Proceedings of the 2012 IEEE International Test Conference, 2012

Novel test detection to improve simulation efficiency - A commercial experiment.

Wen Chen, Nik Sumikawa, Li-C. Wang, Jayanta Bhadra, Xiushan Feng, Magdy S. Abadir

Proceedings of the 2012 IEEE/ACM International Conference on Computer-Aided Design, 2012

2011

Understanding customer returns from a test perspective.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Forward prediction based on wafer sort data - A case study.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 2011 IEEE International Test Conference, 2011

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.

Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir

Proceedings of the Design, Automation and Test in Europe, 2011

2010

Increasing the Efficiency of Simulation-Based Functional Verification Through Unsupervised Support Vector Analysis.

Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2010

Feature-Ranking Methodology to Diagnose Design-Silicon Timing Mismatch.

Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir

IEEE Des. Test Comput., 2010

Impact of multiple input switching on delay test under process variation.

Sean H. Wu, Sreejit Chakravarty, Li-C. Wang

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Selecting the most relevant structural Fmax for system Fmax correlation.

Janine Chen, Jing Zeng, Li-C. Wang, Jeff Rearick, Michael Mateja

Proceedings of the 28th IEEE VLSI Test Symposium, 2010

Mining AC delay measurements for understanding speed-limiting paths.

Janine Chen, Brendon Bolin, Li-C. Wang, Jing Zeng, Dragoljub Gagi Drmanac, Michael Mateja

Proceedings of the 2011 IEEE International Test Conference, 2010

A kernel-based approach for functional test program generation.

Po-Hsien Chang, Li-C. Wang, Jayanta Bhadra

Proceedings of the 2011 IEEE International Test Conference, 2010

On evaluating speed path detection of structural tests.

Jing Zeng, Jing Wang, Chia-Ying Chen, Michael Mateja, Li-C. Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

Analog behavioral modeling flow using statistical learning method.

Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

A non-parametric approach to behavioral device modeling.

Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang

Proceedings of the 11th International Symposium on Quality of Electronic Design (ISQED 2010), 2010

A new sampling method for analog behavioral modeling.

Hui Li, Makram Mansour, Sury Maturi, Li-C. Wang

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

Online selection of effective functional test programs based on novelty detection.

Po-Hsien Chang, Dragoljub Gagi Drmanac, Li-C. Wang

Proceedings of the 2010 International Conference on Computer-Aided Design, 2010

Classification rule learning using subgroup discovery of cross-domain attributes responsible for design-silicon mismatch.

Nicholas Callegari, Dragoljub Gagi Drmanac, Li-C. Wang, Magdy S. Abadir

Proceedings of the 47th Design Automation Conference, 2010

Data learning based diagnosis.

Li-C. Wang

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

Correlating system test Fmax with structural test Fmax and process monitoring measurements.

Janine Chen, Jing Zeng, Li-C. Wang, Michael Mateja

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

Automatic assertion extraction via sequential data mining of simulation traces.

Po-Hsien Chang, Li-C. Wang

Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010

2009

A Statistical Diagnosis Approach for Analyzing Design-Silicon Timing Mismatch.

Nicholas Callegari, Pouria Bastani, Li-C. Wang, Magdy S. Abadir

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009

Minimizing outlier delay test cost in the presence of systematic variability.

Dragoljub Gagi Drmanac, Brendon Bolin, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2009 IEEE International Test Conference, 2009

Data learning techniques and methodology for Fmax prediction.

Janine Chen, Li-C. Wang, Po-Hsien Chang, Jing Zeng, S. Yu, Michael Mateja

Proceedings of the 2009 IEEE International Test Conference, 2009

Feature based similarity search with application to speedpath analysis.

Nicholas Callegari, Li-C. Wang, Pouria Bastani

Proceedings of the 2009 IEEE International Test Conference, 2009

Data Learning Techniques for Functional/System Fmax Prediction.

Li-C. Wang

Proceedings of the 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, 2009

Predicting variability in nanoscale lithography processes.

Dragoljub Gagi Drmanac, Frank Liu, Li-C. Wang

Proceedings of the 46th Design Automation Conference, 2009

Speedpath analysis based on hypothesis pruning and ranking.

Nicholas Callegari, Li-C. Wang, Pouria Bastani

Proceedings of the 46th Design Automation Conference, 2009

Path selection for monitoring unexpected systematic timing effects.

Nicholas Callegari, Pouria Bastani, Li-C. Wang, Sreejit Chakravarty, Alexander Tetelbaum

Proceedings of the 14th Asia South Pacific Design Automation Conference, 2009

2008

A Clock-Less Jitter Spectral Analysis Technique.

Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang

IEEE Trans. Circuits Syst. I Regul. Pap., 2008

Linking Statistical Learning to Diagnosis.

Pouria Bastani, Li-C. Wang, Magdy S. Abadir

IEEE Des. Test Comput., 2008

A Study of Outlier Analysis Techniques for Delay Testing.

Sean H. Wu, Dragoljub Gagi Drmanac, Li-C. Wang

Proceedings of the 2008 IEEE International Test Conference, 2008

Diagnosis of design-silicon timing mismatch with feature encoding and importance ranking - the methodology explained.

Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2008 IEEE International Test Conference, 2008

Functional test selection based on unsupervised support vector analysis.

Onur Guzey, Li-C. Wang, Jeremy R. Levitt, Harry Foster

Proceedings of the 45th Design Automation Conference, 2008

Speedpath prediction based on learning from a small set of examples.

Pouria Bastani, Kip Killpack, Li-C. Wang, Eli Chiprout

Proceedings of the 45th Design Automation Conference, 2008

Statistical diagnosis of unmodeled systematic timing effects.

Pouria Bastani, Nicholas Callegari, Li-C. Wang, Magdy S. Abadir

Proceedings of the 45th Design Automation Conference, 2008

Refining Delay Test Methodology Using Knowledge of Asymmetric Transition Delay.

Sean H. Wu, Sreejit Chakravarty, Alexander Tetelbaum, Li-C. Wang

Proceedings of the 17th IEEE Asian Test Symposium, 2008

2007

A Survey of Hybrid Techniques for Functional Verification.

Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang, Sandip Ray

IEEE Des. Test Comput., 2007

Guest Editors' Introduction: Attacking Functional Verification through Hybrid Techniques.

Jayanta Bhadra, Magdy S. Abadir, Li-C. Wang

IEEE Des. Test Comput., 2007

Statistical analysis and optimization of parametric delay test.

Sean Hsi Yuan Wu, Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2007 IEEE International Test Conference, 2007

Enhancing signal controllability in functional test-benches through automatic constraint extraction.

Onur Guzey, Li-C. Wang, Jayanta Bhadra

Proceedings of the 2007 IEEE International Test Conference, 2007

Analyzing the risk of timing modeling based on path delay tests.

Pouria Bastani, Benjamin N. Lee, Li-C. Wang, Savithri Sundareswaran, Magdy S. Abadir

Proceedings of the 2007 IEEE International Test Conference, 2007

An incremental learning framework for estimating signal controllability in unit-level verification.

Charles H.-P. Wen, Li-C. Wang, Jayanta Bhadra

Proceedings of the 2007 International Conference on Computer-Aided Design, 2007

Coverage-directed test generation through automatic constraint extraction.

Onur Guzey, Li-C. Wang

Proceedings of the IEEE International High Level Design Validation and Test Workshop, 2007

Design-Silicon Timing Correlation A Data Mining Perspective.

Li-C. Wang, Pouria Bastani, Magdy S. Abadir

Proceedings of the 44th Design Automation Conference, 2007

2006

Simulation-Based Functional Test Generation for Embedded Processors.

Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng

IEEE Trans. Computers, 2006

Issues on Test Optimization with Known Good Dies and Known Defective Dies - A Statistical Perspective.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 2006 IEEE International Test Conference, 2006

An Efficient Pruning Method to Guide the Search of Precision Tests in Statistical Timing Space.

Leonard Lee, Li-C. Wang

Proceedings of the 2006 IEEE International Test Conference, 2006

Simulation-based functional test justification using a decision-digram-based Boolean data miner.

Charles H.-P. Wen, Onur Guzey, Li-C. Wang

Proceedings of the 24th International Conference on Computer Design (ICCD 2006), 2006

On bounding the delay of a critical path.

Leonard Lee, Li-C. Wang

Proceedings of the 2006 International Conference on Computer-Aided Design, 2006

Extracting a Simplified View of Design Functionality Based on Vector Simulation.

Onur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Hillel Miller, Magdy S. Abadir

Proceedings of the Hardware and Software, 2006

Extracting a simplified view of design functionality via vector simulation.

Onur Guzey, Charles H.-P. Wen, Li-C. Wang, Tao Feng, Magdy S. Abadir

Proceedings of the Eleventh Annual IEEE International High-Level Design Validation and Test Workshop 2006, 2006

Refined statistical static timing analysis through.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 43rd Design Automation Conference, 2006

2005

Using 2-domain partitioned OBDD data structure in an enhanced symbolic simulator.

Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin

ACM Trans. Design Autom. Electr. Syst., 2005

On A Software-Based Self-Test Methodology and Its Application.

Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Kai Yang, Wei-Ting Liu, Ji-Jan Chen

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

On Silicon-Based Speed Path Identification.

Leonard Lee, Li-C. Wang, Praveen Parvathala, T. M. Mak

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Reducing Pattern Delay Variations for Screening Frequency Dependent Defects.

Benjamin N. Lee, Li-C. Wang, Magdy S. Abadir

Proceedings of the 23rd IEEE VLSI Test Symposium (VTS 2005), 2005

Simulation Data Mining for Functional Test Pattern Justification.

Charles H.-P. Wen, Li-C. Wang

Proceedings of the Sixth International Workshop on Microprocessor Test and Verification (MTV 2005), 2005

Simulation-based target test generation techniques for improving the robustness of a software-based-self-test methodology.

Charles H.-P. Wen, Li-C. Wang, Kwang-Ting Cheng, Wei-Ting Liu, Ji-Jan Chen

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

Hazard-aware statistical timing simulation and its applications in screening frequency-dependent defects.

Benjamin N. Lee, Hui Li, Li-C. Wang, Magdy S. Abadir

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

On Generating Tests to Cover Diverse Worst-Case Timing Corners.

Leonard Lee, Sean H. Wu, Charles H.-P. Wen, Li-C. Wang

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

An Efficient Sequential SAT Solver With Improved Search Strategies.

Feng Lu, Madhu K. Iyer, Ganapathy Parthasarathy, Li-C. Wang, Kwang-Ting Cheng, Kuang-Chien Chen

Proceedings of the 2005 Design, 2005

2004

A new sigma-delta modulator architecture for testing using digital stimulus.

Chee-Kian Ong, Kwang-Ting Cheng, Li-C. Wang

IEEE Trans. Circuits Syst. I Regul. Pap., 2004

Critical path selection for delay fault testing based upon a statistical timing model.

Li-C. Wang, Jing-Jia Liou, Kwang-Ting Cheng

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

Multilevel circuit clustering for delay minimization.

Cliff C. N. Sze, Ting-Chi Wang, Li-C. Wang

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2004

A Signal Correlation Guided Circuit-SAT Solver.

Feng Lu, Li-C. Wang, Kwang-Ting (Tim) Cheng, John Moondanos, Ziyad Hanna

J. Univers. Comput. Sci., 2004

Safety Property Verification Using Sequential SAT and Bounded Model Checking.

Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang

IEEE Des. Test Comput., 2004

New Challenges in Delay Testing of Nanometer, Multigigahertz Designs.

T. M. Mak, Angela Krstic, Kwang-Ting (Tim) Cheng, Li-C. Wang

IEEE Des. Test Comput., 2004

Guest Editors' Introduction: The Verification and Test of Complex Digital ICs.

Magdy S. Abadir, Li-C. Wang

IEEE Des. Test Comput., 2004

A Scalable On-Chip Jitter Extraction Technique.

Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 22nd IEEE VLSI Test Symposium (VTS 2004), 2004

On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design.

Jing Zeng, Magdy S. Abadir, G. Vandling, Li-C. Wang, S. Karako, Jacob A. Abraham

Proceedings of the Fifth International Workshop on Microprocessor Test and Verification (MTV 2004), 2004

On Correlating Structural Tests with Functional Tests for Speed Binning of High Performance Design.

Jing Zeng, Magdy S. Abadir, A. Kolhatkar, G. Vandling, Li-C. Wang, Jacob A. Abraham

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

Static statistical timing analysis for latch-based pipeline designs.

Rob A. Rutenbar, Li-C. Wang, Kwang-Ting Cheng, Sandip Kundu

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

A path-based methodology for post-silicon timing validation.

Leonard Lee, Li-C. Wang, T. M. Mak, Kwang-Ting Cheng

Proceedings of the 2004 International Conference on Computer-Aided Design, 2004

On using a 2-domain partitioned OBDD data structure in verification.

Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Andy Lin

Proceedings of the Ninth IEEE International High-Level Design Validation and Test Workshop 2004, 2004

Regression Simulation: Applying Path-Based Learning In Delay Test and Post-Silicon Validation.

Li-C. Wang

Proceedings of the 2004 Design, 2004

Random Jitter Extraction Technique in a Multi-Gigahertz Signal.

Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 2004 Design, 2004

Pattern Selection for Testing of Deep Sub-Micron Timing Defects.

Mango Chia-Tso Chao, Li-C. Wang, Kwang-Ting Cheng

Proceedings of the 2004 Design, 2004

Improved Symoblic Simulation by Dynamic Funtional Space Partitioning.

Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Chih-Chan Lin

Proceedings of the 2004 Design, 2004

On path-based learning and its applications in delay test and diagnosis.

Li-C. Wang, T. M. Mak, Kwang-Ting Cheng, Magdy S. Abadir

Proceedings of the 41th Design Automation Conference, 2004

An efficient finite-domain constraint solver for circuits.

Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 41th Design Automation Conference, 2004

TranGen: a SAT-based ATPG for path-oriented transition faults.

Kai Yang, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

Efficient reachability checking using sequential SAT.

Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

Jitter spectral extraction for multi-gigahertz signal.

Chee-Kian Ong, Dongwoo Hong, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

Improved symbolic simulation by functional-space decomposition.

Tao Feng, Li-C. Wang, Kwang-Ting Cheng

Proceedings of the 2004 Conference on Asia South Pacific Design Automation: Electronic Design and Solution Fair 2004, 2004

2003

Critical Path Selection for Deep Sub-Micron Delay Test and Timing Validation.

Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting (Tim) Cheng

IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 2003

Guest Editors' Introduction: Speed Test and Speed Binning for Complex ICs.

Kenneth M. Butler, Kwang-Ting (Tim) Cheng, Li-C. Wang

IEEE Des. Test Comput., 2003

Enhanced Symbolic Simulation for Functional Verification of Embedded Array Systems.

Li-C. Wang, Tao Feng, Kwang-Ting (Tim) Cheng, Magdy S. Abadir, Manish Pandey

Des. Autom. Embed. Syst., 2003

Diagnosis of Delay Defects Using Statistical Timing Models.

Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou

Proceedings of the 21st IEEE VLSI Test Symposium (VTS 2003), 27 April, 2003

Using Logic Models To Predict The Detection Behavior Of Statistical Timing Defects.

Li-C. Wang, Angela Krstic, Leonard Lee, Kwang-Ting Cheng, M. Ray Mercer, Thomas W. Williams, Magdy S. Abadir

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Diagnosis-Based Post-Silicon Timing Validation Using Statistical Tools and Methodologies.

Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, T. M. Mak

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

On Structural vs. Functional Testing for Delay Faults.

Angela Krstic, Jing-Jia Liou, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the 4th International Symposium on Quality of Electronic Design (ISQED 2003), 2003

A comparison of BDDs, BMC, and sequential SAT for model checking.

Ganapathy Parthasarathy, Madhu K. Iyer, Kwang-Ting Cheng, Li-C. Wang

Proceedings of the Eighth IEEE International High-Level Design Validation and Test Workshop 2003, 2003

A Circuit SAT Solver With Signal Correlation Guided Learning.

Feng Lu, Li-C. Wang, Kwang-Ting Cheng, Ric C.-Y. Huang

Proceedings of the 2003 Design, 2003

Delay Defect Diagnosis Based Upon Statistical Timing Models - The First Step.

Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, Magdy S. Abadir

Proceedings of the 2003 Design, 2003

A signal correlation guided ATPG solver and its applications for solving difficult industrial cases.

Feng Lu, Li-C. Wang, Kwang-Ting Cheng, John Moondanos, Ziyad Hanna

Proceedings of the 40th Design Automation Conference, 2003

Enhancing diagnosis resolution for delay defects based upon statistical timing and statistical fault models.

Angela Krstic, Li-C. Wang, Kwang-Ting Cheng, Jing-Jia Liou, T. M. Mak

Proceedings of the 40th Design Automation Conference, 2003

Delta-sigma modulator based mixed-signal BIST architecture for SoC.

Chee-Kian Ong, Kwang-Ting (Tim) Cheng, Li-C. Wang

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

Experience in critical path selection for deep sub-micron delay test and timing validation.

Jing-Jia Liou, Li-C. Wang, Angela Krstic, Kwang-Ting Cheng

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

Enhanced symbolic simulation for efficient verification of embedded array systems.

Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Manish Pandey, Magdy S. Abadir

Proceedings of the 2003 Asia and South Pacific Design Automation Conference, 2003

2002

Validation and Verification of Complex Digital Systems: A Practical Perspective.

Li-C. Wang, Magdy S. Abadir

Proceedings of the 3rd Latin American Test Workshop, 2002

On Testing High-Performance Custom Circuits without Explicit Testing of the Internal Faults.

Li-C. Wang, Magdy S. Abadir, Juhong Zhu

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Combining ATPG and Symbolic Simulation for Efficient Validation of Embedded Array Systems.

Ganapathy Parthasarathy, Madhu K. Iyer, Tao Feng, Li-C. Wang, Kwang-Ting Cheng, Magdy S. Abadir

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

Analysis of Delay Test Effectiveness with a Multiple-Clock Scheme.

Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams

Proceedings of the Proceedings IEEE International Test Conference 2002, 2002

On theoretical and practical considerations of path selection for delay fault testing.

Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng

Proceedings of the 2002 IEEE/ACM International Conference on Computer-aided Design, 2002

Fortuitous Detection and its Impact on Test Set Sizes Using Stuck-at and Transition Faults.

Jennifer Dworak, James Wingfield, Brad Cobb, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2002), 2002

Enhancing test efficiency for delay fault testing using multiple-clocked schemes.

Jing-Jia Liou, Li-C. Wang, Kwang-Ting Cheng, Jennifer Dworak, M. Ray Mercer, Rohit Kapur, Thomas W. Williams

Proceedings of the 39th Design Automation Conference, 2002

False-path-aware statistical timing analysis and efficient path selection for delay testing and timing validation.

Jing-Jia Liou, Angela Krstic, Li-C. Wang, Kwang-Ting Cheng

Proceedings of the 39th Design Automation Conference, 2002

2001

Defect-Oriented Testing and Defective-Part-Level Prediction.

Jennifer Dworak, Jason D. Wicker, Sooryong Lee, Michael R. Grimaila, M. Ray Mercer, Kenneth M. Butler, Bret Stewart, Li-C. Wang

IEEE Des. Test Comput., 2001

Analysis of Testing Methodologies for Custom Designs in PowerPCTM Microprocessor.

Magdy S. Abadir, Juhong Zhu, Li-C. Wang

Proceedings of the 19th IEEE VLSI Test Symposium (VTS 2001), Test and Diagnosis in a Nanometric World, 29 April, 2001

Verification and Validation of Complex Digital Systems: An Industrial Perspective.

Magdy S. Abadir, Li-C. Wang

Proceedings of the 2nd International Symposium on Quality of Electronic Design (ISQED 2001), 2001

Module placement with boundary constraints using the sequence-pair representation.

Jianbang Lai, Ming-Shiun Lin, Ting-Chi Wang, Li-C. Wang

Proceedings of ASP-DAC 2001, 2001

2000

On Efficiently Producing Quality Tests for Custom Circuits in PowerPC^TM Microprocessors.

Li-C. Wang, Magdy S. Abadir

J. Electron. Test., 2000

Enhanced DO-RE-ME based defect level prediction using defect site aggregation-MPG-D.

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the Proceedings IEEE International Test Conference 2000, 2000

On the superiority of DO-RE-ME/MPG-D over stuck-at-based defective part level prediction.

Jennifer Dworak, Michael R. Grimaila, Brad Cobb, Ting-Chi Wang, Li-C. Wang, M. Ray Mercer

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

Collaboration between Industry and Academia in Test Research.

Kwang-Ting Cheng, Vishwani D. Agrawal, Jing-Yang Jou, Li-C. Wang, Chi-Feng Wu, Shianling Wu

Proceedings of the 9th Asian Test Symposium (ATS 2000), 4-6 December 2000, Taipei, Taiwan, 2000

1999

Experience in Validation of PowerPCTM Microprocessor Embedded Arrays.

Li-C. Wang, Magdy S. Abadir

J. Electron. Test., 1999

REDO - Probabilistic Excitation and Deterministic Observation - First Commercial Experimen.

Michael R. Grimaila, Sooryong Lee, Jennifer Dworak, Kenneth M. Butler, Bret Stewart, Hari Balachandran, Bryan Houchins, Vineet Mathur, Jaehong Park, Li-C. Wang, M. Ray Mercer

Proceedings of the 17th IEEE VLSI Test Symposium (VTS '99), 1999

Tradeoff analysis for producing high quality tests for custom circuits in PowerPC microprocessors.

Li-C. Wang, Magdy S. Abadir

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

Modeling the probability of defect excitation for a commercial IC with implications for stuck-at fault-based ATPG strategies.

Jennifer Dworak, Michael R. Grimaila, Sooryong Lee, Li-C. Wang, M. Ray Mercer

Proceedings of the Proceedings IEEE International Test Conference 1999, 1999

1998

On measuring the effectiveness of various design validation approaches for PowerPC microprocessor embedded arrays.

Li-C. Wang, Magdy S. Abadir, Jing Zeng

ACM Trans. Design Autom. Electr. Syst., 1998

Test Generation Based on High-Level Assertion Specification for PowerPCTM Microprocessor Embedded Arrays.

Li-C. Wang, Magdy S. Abadir

J. Electron. Test., 1998

On Logic and Transistor Level Design Error Detection of Various Validation Approaches for PowerPC(tm) Microprocessor Arrays.

Li-C. Wang, Magdy S. Abadir, Jing Zeng

Proceedings of the 16th IEEE VLSI Test Symposium (VTS '98), 28 April, 1998

Practical Considerations in Formal Equivalence Checking of PowerPC(tm) Microprocessors.

Arun Chandra, Li-C. Wang, Magdy S. Abadir

Proceedings of the 8th Great Lakes Symposium on VLSI (GLS-VLSI '98), 1998

Measuring the Effectiveness of Various Design Validation Approaches For PowerPC(TM) Microprocessor Arrays.

Li-C. Wang, Magdy S. Abadir, Jing Zeng

Proceedings of the 1998 Design, 1998

Automatic Generation of Assertions for Formal Verification of PowerPC Microprocessor Arrays Using Symbolic Trajectory Evaluation.

Li-C. Wang, Magdy S. Abadir, Nari Krishnamurthy

Proceedings of the 35th Conference on Design Automation, 1998

1997

A New Validation Methodology Combining Test and Formal Verification for PowerPC^TM Microprocessor Arrays.

Li-C. Wang, Magdy S. Abadir

Proceedings of the Proceedings IEEE International Test Conference 1997, 1997

1996

Using Target Faults To Detect Non-Tartget Defects.

Li-C. Wang, M. Ray Mercer, Thomas W. Williams

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996

A Better ATPG Algorithm and Its Design Principles.

Li-C. Wang, M. Ray Mercer, Thomas W. Williams

Proceedings of the 1996 International Conference on Computer Design (ICCD '96), 1996

1995

On the decline of testing efficiency as fault coverage approaches 100%.

Li-C. Wang, M. Ray Mercer, Sophia W. Kao, Thomas W. Williams

Proceedings of the 13th IEEE VLSI Test Symposium (VTS'95), April 30, 1995

On Efficiently and Reliably Achieving Low Defective Part Levels.

Li-C. Wang, M. Ray Mercer, Thomas W. Williams

Proceedings of the Proceedings IEEE International Test Conference 1995, 1995

Enhanced testing performance via unbiased test sets.

Li-C. Wang, M. Ray Mercer, Thomas W. Williams

Proceedings of the 1995 European Design and Test Conference, 1995

1993

Experience in Massively Parallel Discrete Event Simulation.

Albert G. Greenberg, Boris D. Lubachevsky, Li-C. Wang

Proceedings of the 5th Annual ACM Symposium on Parallel Algorithms and Architectures, 1993

1991

Parallel algorithm and complexity results for telephone link simulation.

Vijaya Ramachandran, Li-Chung Wang

Proceedings of the Third IEEE Symposium on Parallel and Distributed Processing, 1991