Lev M. Sambursky

According to our database, Lev M. Sambursky authored at least 8 papers between 2011 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).

Konstantin O. Petrosyants, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2018

Prediction of High-Temperature Operation (up to +300°C) of Reference Voltage Source Built with Temperature-Tolerant Production Technology.

Lev M. Sambursky, Dmitry A. Parfenov, Mamed R. Ismail-Zade, Alexander S. Boldov, Borislav S. Dubyaga

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).

Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin

Microelectron. Reliab., 2017

Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

J. Electron. Test., 2017

Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

Proceedings of the 17th Latin-American Test Symposium, 2016

2013

Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko

Proceedings of the East-West Design & Test Symposium, 2013

2011

TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies.

Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov

Proceedings of the 9th East-West Design & Test Symposium, 2011