Letícia Maria Veiras Bolzani

According to our database, Letícia Maria Veiras Bolzani authored at least 98 papers between 2003 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2024

A DfT Strategy for Guaranteeing ReRAM's Quality after Manufacturing.

Thiago Santos Copetti, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Veiras Bolzani Poehls

J. Electron. Test., April, 2024

Understanding Transistor Aging Impact on the Behavior of RRAM Cells.

Seyed Hossein Hashemi Shadmehri, Supriya Chakraborty, Thiago Santos Copetti, Fabian Luis Vargas, Letícia Maria Bolzani Poehls

Proceedings of the 32nd IFIP/IEEE International Conference on Very Large Scale Integration, 2024

A Fully Automated Platform for Evaluating ReRAM Crossbars.

Rebecca Pelke, Felix Staudigl, Niklas Thomas, Nils Bosbach, Mohammed Hossein, José Cubero-Cascante, Letícia Maria Veiras Bolzani, Rainer Leupers, Jan Moritz Joseph

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Analyzing the Use of Temperature to Facilitate Fault Propagation in ReRAMs.

Thiago Copetti, A. Chordia, Moritz Fieback, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Veiras Bolzani

Proceedings of the 25th IEEE Latin American Test Symposium, 2024

Lifecycle Management of Emerging Memories.

Moritz Fieback, Letícia Maria Veiras Bolzani Poehls

Proceedings of the IEEE European Test Symposium, 2024

2023

Invited Paper: A Holistic Fault Injection Platform for Neuromorphic Hardware.

Felix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Letícia Maria Veiras Bolzani Poehls, Rainer Leupers

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Evaluating a New RRAM Manufacturing Test Strategy.

Thiago Santos Copetti, A. Castelnuovo, Tobias Gemmeke, Letícia Maria Veiras Bolzani

Proceedings of the 24th IEEE Latin American Test Symposium, 2023

Embedded Tutorial - RRAMs: How to Guarantee Their Quality Test after Manufacturing?

Letícia Maria Veiras Bolzani

Proceedings of the 26th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, 2023

Fault Injection in Native Logic-in-Memory Computation on Neuromorphic Hardware.

Felix Staudigl, Thorben Fetz, Rebecca Pelke, Dominik Sisejkovic, Jan Moritz Joseph, Letícia Maria Bolzani Pöhls, Rainer Leupers

Proceedings of the 60th ACM/IEEE Design Automation Conference, 2023

Characterization and Test of Intermittent Over RESET in RRAMs.

Hanzhi Xun, Moritz Fieback, Sicong Yuan, Hassen Aziza, Mathijs Heidekamp, Thiago Copetti, Letícia Maria Veiras Bolzani Poehls, Mottaqiallah Taouil, Said Hamdioui

Proceedings of the 32nd IEEE Asian Test Symposium, 2023

2022

Exploring an On-Chip Sensor to Detect Unique Faults in RRAMs.

Thiago Santos Copetti, M. Nilovic, Moritz Fieback, Tobias Gemmeke, Said Hamdioui, Letícia Maria Bolzani Poehls

Proceedings of the 23rd IEEE Latin American Test Symposium, 2022

Hierarchical Memory Diagnosis.

Guilherme Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Letícia Maria Veiras Bolzani, Said Hamdioui

Proceedings of the IEEE European Test Symposium, 2022

NEUROTEC I: Neuro-inspired Artificial Intelligence Technologies for the Electronics of the Future.

Melvin Galicia, Stephan Menzel, Farhad Merchant, Maximilian Müller, Hsin-Yu Chen, Qing-Tai Zhao, Felix Cüppers, Abdur R. Jalil, Qi Shu, Peter Schüffelgen, Gregor Mussler, Carsten Funck, Christian Lanius, Stefan Wiefels, Moritz von Witzleben, Christopher Bengel, Nils Kopperberg, Tobias Ziegler, R. Walied Ahmad, Alexander Krüger, Letícia Maria Bolzani Pöhls, Regina Dittmann, Susanne Hoffmann-Eifert, Vikas Rana, Detlev Grützmacher, Matthias Wuttig, Dirk J. Wouters, Andrei Vescan, Tobias Gemmeke, Joachim Knoch, Max Christian Lemme, Rainer Leupers, Rainer Waser

Proceedings of the 2022 Design, Automation & Test in Europe Conference & Exhibition, 2022

X-Fault: Impact of Faults on Binary Neural Networks in Memristor-Crossbar Arrays with Logic-in-Memory Computation.

Felix Staudigl, Karl J. X. Sturm, Maximilian Bartel, Thorben Fetz, Dominik Sisejkovic, Jan Moritz Joseph, Letícia Maria Bolzani Pöhls, Rainer Leupers

Proceedings of the 4th IEEE International Conference on Artificial Intelligence Circuits and Systems, 2022

2021

Hard-to-Detect Fault Analysis in FinFET SRAMs.

Guilherme Cardoso Medeiros, Moritz Fieback, Lizhou Wu, Mottaqiallah Taouil, Letícia Maria Bolzani Poehls, Said Hamdioui

IEEE Trans. Very Large Scale Integr. Syst., 2021

Evaluation of Single Event Upset Susceptibility of FinFET-based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Letícia Maria Bolzani Poehls, Tiago Roberto Balen

J. Electron. Test., 2021

Review of Manufacturing Process Defects and Their Effects on Memristive Devices.

Letícia Maria Veiras Bolzani, Moritz Fieback, Susanne Hoffmann-Eifert, Thiago Copetti, E. Brum, Stephan Menzel, Said Hamdioui, Tobias Gemmeke

J. Electron. Test., 2021

A DfT Strategy for Detecting Emerging Faults in RRAMs.

Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Bolzani Pöhls

Proceedings of the VLSI-SoC: Technology Advancement on SoC Design, 2021

Validating a DFT Strategy's Detection Capability regarding Emerging Faults in RRAMs.

Thiago Santos Copetti, Tobias Gemmeke, Letícia Maria Veiras Bolzani

Proceedings of the 29th IFIP/IEEE International Conference on Very Large Scale Integration, 2021

Evaluating the Impact of Process Variation on RRAMs.

E. Brum, Moritz Fieback, Thiago Santos Copetti, H. Jiayi, Said Hamdioui, Fabian Vargas, Letícia Maria Veiras Bolzani

Proceedings of the 22nd IEEE Latin American Test Symposium, 2021

Detecting Random Read Faults to Reduce Test Escapes in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 26th IEEE European Test Symposium, 2021

Improving the Detection of Undefined State Faults in FinFET SRAMs.

G. Cardoso Medeiros, Moritz Fieback, Thiago Santos Copetti, Anteneh Gebregiorgis, Mottaqiallah Taouil, Leticia B. Poehls, Said Hamdioui

Proceedings of the 16th International Conference on Design & Technology of Integrated Systems in Nanoscale Era, 2021

2020

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects.

Thiago Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

J. Electron. Test., 2020

Evaluating the Impact of Ionizing Particles on FinFET -based SRAMs with Weak Resistive Defects.

Thiago Copetti, Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Said Hamdioui, Leticia Bolzani Poehls, Tiago R. Balen

Proceedings of the IEEE Latin-American Test Symposium, 2020

2019

Evaluating the Impact of Temperature on Dynamic Fault Behaviour of FinFET-Based SRAMs with Resistive Defects.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

J. Electron. Test., 2019

A New Approach to Guarantee Critical Task Schedulability in TDMA-Based Bus Access of Multicore Architecture.

Estevan Lara, Guilherme Debon, Roger C. Goerl, Paulo Ricardo Cechelero Villa, Dorian Schramm, Leticia B. Poehls, Fabian Vargas

Proceedings of the IEEE Latin American Test Symposium, 2019

A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects.

Thiago Santos Copetti, Tiago R. Balen, E. Brum, C. Aquistapace, Leticia Bolzani Poehls

Proceedings of the IEEE Latin American Test Symposium, 2019

DFT Scheme for Hard-to-Detect Faults in FinFET SRAMs.

Guilherme Cardoso Medeiros, Mottaqiallah Taouil, Moritz Fieback, Leticia Bolzani Poehls, Said Hamdioui

Proceedings of the 24th IEEE European Test Symposium, 2019

2018

A defect-oriented test approach using on-Chip current sensors for resistive defects in FinFET SRAMs.

G. Cardoso Medeiros, Letícia Maria Veiras Bolzani, Mottaqiallah Taouil, Fabian Vargas, Said Hamdioui

Microelectron. Reliab., 2018

An efficient EDAC approach for handling multiple bit upsets in memory array.

Roger C. Goerl, Paulo Ricardo Cechelero Villa, Letícia Maria Veiras Bolzani, Eduardo Augusto Bezerra, Fabian Luis Vargas

Microelectron. Reliab., 2018

A hardware-based approach for SEU monitoring in SRAMs with weak resistive defects.

George Redivo Pinto, Guilherme Cardoso Medeiros, Fabian Vargas, Leticia Bolzani Poehls

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

Influence of temperature on dynamic fault behavior due to resistive defects in FinFET-based SRAMs.

G. Cardoso Medeiros, E. Brum, Leticia Bolzani Poehls, Thiago Copetti, Tiago R. Balen

Proceedings of the 19th IEEE Latin-American Test Symposium, 2018

A path energy control technique for energy efficiency on wireless sensor networks.

F. Tubiello, Leticia Bolzani Poehls, Thais Webber, César Augusto Missio Marcon, Fabian Vargas

Proceedings of the 9th IEEE Latin American Symposium on Circuits & Systems, 2018

2017

Evaluating the Impact of Resistive Defects on FinFET-Based SRAMs.

Thiago Santos Copetti, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls, Tiago R. Balen

Proceedings of the VLSI-SoC: Opportunities and Challenges Beyond the Internet of Things, 2017

Analyzing the behavior of FinFET SRAMs with resistive defects.

Thiago Santos Copetti, Tiago R. Balen, Guilherme Cardoso Medeiros, Letícia Maria Bolzani Poehls

Proceedings of the 2017 IFIP/IEEE International Conference on Very Large Scale Integration, 2017

Analysis of single-event upsets in a Microsemi ProAsic3E FPGA.

Paulo Ricardo Cechelero Villa, Roger C. Goerl, Fabian Vargas, Leticia B. Poehls, Nilberto H. Medina, Nemitala Added, Vitor A. P. de Aguiar, Eduardo L. A. Macchione, Fernando Aguirre, Marcilei Aparecida Guazzelli da Silveira, Eduardo Augusto Bezerra

Proceedings of the 18th IEEE Latin American Test Symposium, 2017

2016

Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations.

Andres F. Gomez, Felipe Lavratti, Guilherme Medeiros Machado, M. Sartori, Letícia Maria Veiras Bolzani, Víctor H. Champac, Fabian Vargas

Microelectron. Reliab., 2016

Selected Peer Reviewed Articles from the 17th "IEEE Latin-American Test Symposium, " Foz do Iguaçu, Brazil, April 6-8, 2016.

Letícia Maria Bolzani Poehls

J. Low Power Electron., 2016

Identification and Rejuvenation of NBTI-Critical Logic Paths in Nanoscale Circuits.

Maksim Jenihhin, Giovanni Squillero, Thiago Santos Copetti, Valentin Tihhomirov, Sergei Kostin, Marco Gaudesi, Fabian Vargas, Jaan Raik, Matteo Sonza Reorda, Leticia Bolzani Poehls, Raimund Ubar, Guilherme Cardoso Medeiros

J. Electron. Test., 2016

NBTI-Aware Design of Integrated Circuits: A Hardware-Based Approach for Increasing Circuits' Life Time.

Thiago Copetti, Guilherme Cardoso Medeiros, Leticia Bolzani Poehls, Fabian Vargas

J. Electron. Test., 2016

Analyzing the Impact of SEUs on SRAMs with Resistive-Bridge Defects.

G. Cardoso Medeiros, Letícia Maria Bolzani Pöhls, Fabian Vargas

Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016

Analyzing NBTI impact on SRAMs with resistive-open defects.

M. Tulio Martins, G. Cardoso Medeiros, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Poehls

Proceedings of the 17th Latin-American Test Symposium, 2016

Gate-level modelling of NBTI-induced delays under process variations.

Thiago Copetti, Guilherme Medeiros Machado, Leticia Bolzani Poehls, Fabian Vargas, Sergei Kostin, Maksim Jenihhin, Jaan Raik, Raimund Ubar

Proceedings of the 17th Latin-American Test Symposium, 2016

A dynamic TDMA-based sleep scheduling to minimize WSN energy consumption.

Adelcio Biazi, César A. M. Marcon, Fauzi de M. Shubeita, Leticia B. Poehls, Thais Webber, Fabian Vargas

Proceedings of the 13th IEEE International Conference on Networking, Sensing, and Control, 2016

2015

An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging.

Andres F. Gomez, Leticia B. Poehls, Fabian Vargas, Víctor H. Champac

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Evaluating a Hardware-Based Approach for Detecting Resistive-Open Defects in SRAMs.

Felipe Lavratti, Letícia Maria Bolzani Poehls, Fabian Vargas, Andrea Calimera, Enrico Macii

Proceedings of the 28th International Conference on VLSI Design, 2015

OcNoC: Efficient One-Cycle Router Implementation for 3D Mesh Network-on-Chip.

Ramon Fernandes, Lucas Brahm, Thais Webber, Rodrigo Cataldo, Leticia B. Poehls, César A. M. Marcon

Proceedings of the 28th International Conference on VLSI Design, 2015

Rejuvenation of nanoscale logic at NBTI-critical paths using evolutionary TPG.

N. Palermo, Valentin Tihhomirov, Thiago Santos Copetti, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Marco Gaudesi, Giovanni Squillero, Matteo Sonza Reorda, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 16th Latin-American Test Symposium, 2015

NBTI-aware design of integrated circuits: a hardware-based approach.

Thiago Copetti, G. Cardoso Medeiros, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the 16th Latin-American Test Symposium, 2015

Message from the LATS2015 Chairs.

Víctor H. Champac, Yervant Zorian, Letícia Maria Bolzani Pöhls, Vishwani D. Agrawal

Proceedings of the 16th Latin-American Test Symposium, 2015

Task partitioning optimization algorithm for energy saving and load balance on NoC-based MPSoCs.

Marco P. Stefani, Thais Webber, Ramon Fernandes, Rodrigo Cataldo, Leticia B. Poehls, César A. M. Marcon

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

On-chip Watchdog to monitor RTOS activity in MPSoC exposed to noisy environment.

Christofer de Oliveira, Leticia Bolzani Poehls, Fabian Vargas

Proceedings of the 10th International Workshop on the Electromagnetic Compatibility of Integrated Circuits, 2015

SPICE-Inspired Fast Gate-Level Computation of NBTI-induced Delays in Nanoscale Logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Thiago Copetti, Fabian Vargas, Letícia Maria Bolzani Pöhls

Proceedings of the 18th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2015

2014

Selected Peer-Reviewed Articles from the 14th IEEE Latin-American Test Workshop, Cordoba, Argentina, April 3-5, 2013.

Letícia Maria Bolzani Poehls, Matteo Sonza Reorda

J. Low Power Electron., 2014

Modeling of Physical Defects in PN Junction Based Graphene Devices.

Sandeep Miryala, Matheus Oleiro, Letícia Maria Bolzani Pöhls, Andrea Calimera, Enrico Macii, Massimo Poncino

J. Electron. Test., 2014

An On-Chip Sensor to Monitor NBTI Effects in SRAMs.

Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas, Rubem Dutra Ribeiro Fagundes

J. Electron. Test., 2014

Pre-mapping Algorithm for Heterogeneous MPSoCs.

César A. M. Marcon, Thais Webber, Leticia B. Poehls, Igor K. Pinotti

Proceedings of the 2014 27th International Conference on VLSI Design, 2014

Tiny NoC: A 3D Mesh Topology with Router Channel Optimization for Area and Latency Minimization.

César A. M. Marcon, Ramon Fernandes, Rodrigo Cataldo, Fernando Grando, Thais Webber, Ana Benso, Leticia B. Poehls

Proceedings of the 2014 27th International Conference on VLSI Design, 2014

Hierarchical identification of NBTI-critical gates in nanoscale logic.

Sergei Kostin, Jaan Raik, Raimund Ubar, Maksim Jenihhin, Fabian Vargas, Letícia Maria Bolzani Poehls, Thiago Santos Copetti

Proceedings of the 15th Latin American Test Workshop, 2014

2013

A flexible framework for modeling and simulation of multipurpose wireless networks.

Vinicius Bohrer, Ramon Fernandes, César A. M. Marcon, Thais Webber, Leticia B. Poehls, Ricardo M. Czekster, Fabiano Hessel

Proceedings of the 24th IEEE International Symposium on Rapid System Prototyping, 2013

Investigating the behavior of physical defects in pn-junction based reconfigurable graphene devices.

Sandeep Miryala, Andrea Calimera, Enrico Macii, Massimo Poncino, Letícia Maria Veiras Bolzani Poehls

Proceedings of the 14th Latin American Test Workshop, 2013

Technique based on On-Chip Current Sensors and Neighbourhood Comparison Logic to detect resistive-open defects in SRAMs.

Felipe Lavratti, Letícia Maria Veiras Bolzani, Andrea Calimera, Fabian Vargas, Enrico Macii

Proceedings of the 14th Latin American Test Workshop, 2013

Integrating embedded test infrastructure in SRAM cores to detect aging.

W. Prates, Letícia Maria Veiras Bolzani, Gurgen Harutyunyan, A. Davtyan, Fabian Vargas, Yervant Zorian

Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013

Phoenix NoC: A distributed fault tolerant architecture.

César A. M. Marcon, Alexandre M. Amory, Thais Webber, Thomas Volpato, Leticia B. Poehls

Proceedings of the 2013 IEEE 31st International Conference on Computer Design, 2013

Reliability analysis of an on-chip watchdog for embedded systems exposed to radiation and EMI.

C. Oliveira, Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez, Alexandre Boyer

Proceedings of the 9th International Workshop on Electromagnetic Compatibility of Integrated Circuits, 2013

Identifying NBTI-Critical Paths in Nanoscale Logic.

Raimund Ubar, Fabian Vargas, Maksim Jenihhin, Jaan Raik, Sergei Kostin, Letícia Maria Bolzani Poehls

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2012

Evaluating the Effectiveness of a Software-Based Technique Under SEEs Using FPGA-Based Fault Injection Approach.

Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, N. Marroni, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas

J. Electron. Test., 2012

A Test Platform for Dependability Analysis of SoCs Exposed to EMI and Radiation.

Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Edmundo Gatti, Fernando Hernandez

J. Electron. Test., 2012

Investigating the use of an on-chip sensor to monitor NBTI effect in SRAM.

Arthur Ceratti, Thiago Copetti, Letícia Maria Veiras Bolzani, Fabian Vargas

Proceedings of the 13th Latin American Test Workshop, 2012

On-chip aging sensor to monitor NBTI effect in nano-scale SRAM.

Arthur Ceratti, Thiago Copetti, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2012

2011

12th "IEEE Latin-American Test Workshop" Porto de Galinhas, Brazil, 27-30 March 2011.

Víctor H. Champac, Fernanda Gusmão de Lima Kastensmidt, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas, Yervant Zorian

J. Low Power Electron., 2011

Using an FPGA-based fault injection technique to evaluate software robustness under SEEs: A case study.

Marta Portela-García, Almudena Lindoso, Luis Entrena, Mario García-Valderas, Celia López-Ongil, Bernardo Pianta, Letícia Maria Bolzani Poehls, Fabian Vargas

Proceedings of the 12th Latin American Test Workshop, 2011

A new Built-In Current Sensor scheme to detect dynamic faults in Nano-Scale SRAMs.

Felipe Lavratti, Andrea Calimera, Letícia Maria Veiras Bolzani, Fabian Vargas, Enrico Macii

Proceedings of the 12th Latin American Test Workshop, 2011

Configurable platform for IC combined tests of total-ionizing dose radiation and electromagnetic immunity.

Juliano Benfica, Letícia Maria Bolzani Poehls, Fabian Vargas, José Lipovetzky, Ariel Lutenberg, Sebastián E. García, Edmundo Gatti, Fernando Hernandez, Ney Laert Vilar Calazans

Proceedings of the 12th Latin American Test Workshop, 2011

An intellectual property core to detect task schedulling-related faults in RTOS-based embedded systems.

Dhiego Silva, Letícia Maria Veiras Bolzani, Fabian Vargas

Proceedings of the 17th IEEE International On-Line Testing Symposium (IOLTS 2011), 2011

A Hardware-Based Approach for Fault Detection in RTOS-Based Embedded Systems.

Dhiego Silva, Kleber Stangherlin, Letícia Maria Veiras Bolzani, Fabian Vargas

Proceedings of the 16th European Test Symposium, 2011

2010

A Hybrid Approach for Detection and Correction of Transient Faults in SoCs.

Paolo Bernardi, Letícia Maria Veiras Bolzani Poehls, Michelangelo Grosso, Matteo Sonza Reorda

IEEE Trans. Dependable Secur. Comput., 2010

Towards a transmission power self-optimization in reliable Wireless Sensor Networks.

Felipe Lavratti, Alex R. Pinto, Dárcio Prestes, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Montez

Proceedings of the 11th Latin American Test Workshop, 2010

BICS-based March test for resistive-open defect detection in SRAMs.

Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas

Proceedings of the 11th Latin American Test Workshop, 2010

Investigating the Use of BICS to detect resistive-open defects in SRAMs.

Raul Chipana, Letícia Maria Veiras Bolzani, Fabian Vargas, Jorge Semião, Juan J. Rodríguez-Andina, Isabel C. Teixeira, João Paulo Teixeira

Proceedings of the 16th IEEE International On-Line Testing Symposium (IOLTS 2010), 2010

Evaluating a Transmission Power Self-Optimization Technique for WSN in EMI Environments.

Felipe Lavratti, Alex R. Pinto, Letícia Maria Veiras Bolzani, Fabian Vargas, Carlos Barros Montez, Fernando Hernandez, Edmundo Gatti, C. Silva

Proceedings of the 13th Euromicro Conference on Digital System Design, 2010

2009

Placement-aware Clustering for Integrated Clock and Power Gating.

Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2009), 2009

A Hardware-Scheduler for Fault Detection in RTOS-Based Embedded Systems.

Jimmy Tarrillo, Letícia Maria Veiras Bolzani Poehls, Fabian Vargas

Proceedings of the 12th Euromicro Conference on Digital System Design, 2009

Enabling concurrent clock and power gating in an industrial design flow.

Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Enrico Macii, Massimo Poncino

Proceedings of the Design, Automation and Test in Europe, 2009

2008

Integrating Clock Gating and Power Gating for Combined Dynamic and Leakage Power Optimization in Digital CMOS Circuits.

Enrico Macii, Letícia Maria Veiras Bolzani, Andrea Calimera, Alberto Macii, Massimo Poncino

Proceedings of the 11th Euromicro Conference on Digital System Design: Architectures, 2008

2007

A software-based methodology for the generation of peripheral test sets based on high-level descriptions.

Letícia Maria Veiras Bolzani, Edgar E. Sánchez, Matteo Sonza Reorda

Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, 2007

An optimized hybrid approach to provide fault detection and correction in SoCs.

Letícia Maria Veiras Bolzani, Paolo Bernardi, Matteo Sonza Reorda

Proceedings of the 20th Annual Symposium on Integrated Circuits and Systems Design, 2007

An Automated Methodology for Cogeneration of Test Blocks for Peripheral Cores.

Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Matteo Sonza Reorda, Giovanni Squillero

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

A Hybrid Approach to Fault Detection and Correction in SoCs.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda

Proceedings of the 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 2007

Coupling EA and high-level metrics for the automatic generation of test blocks for peripheral cores.

Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero

Proceedings of the Genetic and Evolutionary Computation Conference, 2007

Extended Fault Detection Techniques for Systems-on-Chip.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Matteo Sonza Reorda

Proceedings of the 10th IEEE Workshop on Design & Diagnostics of Electronic Circuits & Systems (DDECS 2007), 2007

Co-evolution of test programs and stimuli vectors for testing of embedded peripheral cores.

Letícia Maria Veiras Bolzani, Ernesto Sánchez, Massimiliano Schillaci, Giovanni Squillero

Proceedings of the IEEE Congress on Evolutionary Computation, 2007

2006

A New Hybrid Fault Detection Technique for Systems-on-a-Chip.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante

IEEE Trans. Computers, 2006

Software-Based On-Line Test of Communication Peripherals in Processor-Based Systems for Automotive Applications.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Alberto Manzone, Massimo Osella, Massimo Violante, Matteo Sonza Reorda

Proceedings of the Seventh International Workshop on Microprocessor Test and Verification (MTV 2006), 2006

2005

On-Line Detection of Control-Flow Errors in SoCs by Means of an Infrastructure IP Core.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante

Proceedings of the 2005 International Conference on Dependable Systems and Networks (DSN 2005), 28 June, 2005

An Integrated Approach for Increasing the Soft-Error Detection Capabilities in SoCs processors.

Paolo Bernardi, Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Massimo Violante

Proceedings of the 20th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2005), 2005

2004

Hybrid Soft Error Detection by Means of Infrastructure IP Cores.

Letícia Maria Veiras Bolzani, Maurizio Rebaudengo, Matteo Sonza Reorda, Fabian Vargas, Massimo Violante

Proceedings of the 10th IEEE International On-Line Testing Symposium (IOLTS 2004), 2004

2003

Introducing SW-Based Fault Handling Mechanisms to Cope with EMI in Embedded Electronics: Are They A Good Remedy?

Fabian Vargas, Diogo B. Brum, Dárcio Prestes, Letícia Maria Veiras Bolzani, Eduardo Luis Rhod, Matteo Sonza Reorda

Proceedings of the 9th IEEE International On-Line Testing Symposium (IOLTS 2003), 2003