LeRoy Winemberg

According to our database, LeRoy Winemberg authored at least 38 papers between 2005 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Fault-based Built-in Self-test and Evaluation of Phase Locked Loops.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

ACM Trans. Design Autom. Electr. Syst., 2021

2019

Digital Built-in Self-Test for Phased Locked Loops to Enable Fault Detection.

Mehmet Ince, Ender Yilmaz, Wei Fu, Joonsung Park, Krishnaswamy Nagaraj, LeRoy Winemberg, Sule Ozev

Proceedings of the 24th IEEE European Test Symposium, 2019

2017

Design of Reliable SoCs With BIST Hardware and Machine Learning.

Mehdi Sadi, Gustavo K. Contreras, Jifeng Chen, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

Test-Point Insertion Efficiency Analysis for LBIST in High-Assurance Applications.

Miao Tony He, Gustavo K. Contreras, Dat Tran, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Very Large Scale Integr. Syst., 2017

TRO: An On-Chip Ring Oscillator-Based GHz Transient IR-Drop Monitor.

Xiaoxiao Wang, Pengyuan Jiao, Mehdi Sadi, Donglin Su, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

SoC Speed Binning Using Machine Learning and On-Chip Slack Sensors.

Mehdi Sadi, Sukeshwar Kannan, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2017

Learning the process for correlation analysis.

Sebastian Siatkowski, Li-C. Wang, Nik Sumikawa, LeRoy Winemberg

Proceedings of the 35th IEEE VLSI Test Symposium, 2017

Some considerations on choosing an outlier method for automotive product lines.

Li-C. Wang, Sebastian Siatkowski, Chuanhe Jay Shan, Matthew Nero, Nikolas Sumikawa, LeRoy Winemberg

Proceedings of the IEEE International Test Conference, 2017

Built-in self-test for stability measurement of low dropout regulator.

Jae Woong Jeong, Ender Yilmaz, LeRoy Winemberg, Sule Ozev

Proceedings of the IEEE International Test Conference, 2017

Evaluation of loop transfer function based dynamic testing of LDOs.

Mehmet Ince, Ender Yilmaz, Jae Woong Jeong, LeRoy Winemberg, Sule Ozev

Proceedings of the International Test Conference in Asia, 2017

2016

A Novel Peak Power Supply Noise Measurement and Adaptation System for Integrated Circuits.

Xiaoxiao Wang, Dongrong Zhang, Donglin Su, LeRoy Winemberg, Mark M. Tehranipoor

IEEE Trans. Very Large Scale Integr. Syst., 2016

Test-point insertion efficiency analysis for LBIST applications.

Miao Tony He, Gustavo K. Contreras, Mark M. Tehranipoor, Dat Tran, LeRoy Winemberg

Proceedings of the 34th IEEE VLSI Test Symposium, 2016

Putting wasted clock cycles to use: Enhancing fortuitous cell-aware fault detection with scan shift capture.

Fanchen Zhang, Daphne Hwong, Yi Sun, Allison Garcia, Soha Alhelaly, Geoff Shofner, LeRoy Winemberg, Jennifer Dworak

Proceedings of the 2016 IEEE International Test Conference, 2016

BIST-RM: BIST-assisted reliability management of SoCs using on-chip clock sweeping and machine learning.

Mehdi Sadi, Gustavo K. Contreras, Dat Tran, Jifeng Chen, LeRoy Winemberg, Mark M. Tehranipoor

Proceedings of the 2016 IEEE International Test Conference, 2016

An efficient all-digital IR-Drop Alarmer for DVFS-based SoC.

Liting Yu, Xiaoxiao Wang, Yuanqing Cheng, Xiaoying Zhao, Pengyuan Jiao, Aixin Chen, Donglin Su, LeRoy Winemberg, Mehdi Sadi, Mark M. Tehranipoor

Proceedings of the IEEE International Symposium on Circuits and Systems, 2016

2015

Aging Adaption in Integrated Circuits Using a Novel Built-In Sensor.

Xiaoxiao Wang, LeRoy Winemberg, Donglin Su, Dat Tran, Saji George, Nisar Ahmed, Steve Palosh, Allan Dobin, Mark M. Tehranipoor

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015

A robust digital sensor IP and sensor insertion flow for in-situ path timing slack monitoring in SoCs.

Mehdi Sadi, LeRoy Winemberg, Mark M. Tehranipoor

Proceedings of the 33rd IEEE VLSI Test Symposium, 2015

Generalization of an outlier model into a "global" perspective.

Sebastian Siatkowski, Chia-Ling Chang, Li-C. Wang, Nikolas Sumikawa, LeRoy Winemberg, W. Robert Daasch

Proceedings of the 2015 IEEE International Test Conference, 2015

LBIST pattern reduction by learning ATPG test cube properties.

Gustavo K. Contreras, Yang Zhao, Nisar Ahmed, LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the Sixteenth International Symposium on Quality Electronic Design, 2015

Speed Binning Using Machine Learning And On-chip Slack Sensors.

Mehdi Sadi, Mark M. Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg

Proceedings of the 25th edition on Great Lakes Symposium on VLSI, GLVLSI 2015, Pittsburgh, PA, USA, May 20, 2015

Predictive LBIST model and partial ATPG for seed extraction.

Gustavo K. Contreras, Nisar Ahmed, LeRoy Winemberg, Mark M. Tehranipoor

Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2015

2014

Identification of testable representative paths for low-cost verification of circuit performance during manufacturing and in-field tests.

Jifeng Chen, LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the 32nd IEEE VLSI Test Symposium, 2014

On-chip sensor selection for effective speed-binning.

Qihang Shi, Mohammad Tehranipoor, Xiaoxiao Wang, LeRoy Winemberg

Proceedings of the IEEE 57th International Midwest Symposium on Circuits and Systems, 2014

2013

Efficient Pattern Generation for Small-Delay Defects Using Selection of Critical Faults.

Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor

J. Electron. Test., 2013

Fault analysis and simulation of large scale industrial mixed-signal circuits.

Ender Yilmaz, Geoff Shofner, LeRoy Winemberg, Sule Ozev

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Design and Analysis of a Delay Sensor Applicable to Process/Environmental Variations and Aging Measurements.

Xiaoxiao Wang, Mohammad Tehranipoor, Saji George, Dat Tran, LeRoy Winemberg

IEEE Trans. Very Large Scale Integr. Syst., 2012

Radic: A standard-cell-based sensor for on-chip aging and flip-flop metastability measurements.

Xiaoxiao Wang, Dat Tran, Saji George, LeRoy Winemberg, Nisar Ahmed, Steve Palosh, Allan Dobin, Mohammad Tehranipoor

Proceedings of the 2012 IEEE International Test Conference, 2012

Screening customer returns with multivariate test analysis.

Nik Sumikawa, Jeff Tikkanen, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 2012 IEEE International Test Conference, 2012

2011

Special session: Hot topic: Smart silicon.

LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Special session 5B: Panel How much toggle activity should we be testing with?

Xiaoqing Wen, Mohammad Tehranipoor, Rohit Kapur, Anand Bhat, Amitava Majumdar, LeRoy Winemberg

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Understanding customer returns from a test perspective.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Case Study: Efficient SDD test generation for very large integrated circuits.

Ke Peng, Fang Bao, Geoff Shofner, LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the 29th IEEE VLSI Test Symposium, 2011

Forward prediction based on wafer sort data - A case study.

Nik Sumikawa, Dragoljub Gagi Drmanac, Li-C. Wang, LeRoy Winemberg, Magdy S. Abadir

Proceedings of the 2011 IEEE International Test Conference, 2011

Critical Fault-Based Pattern Generation for Screening SDDs.

Fang Bao, Ke Peng, Mahmut Yilmaz, Krishnendu Chakrabarty, LeRoy Winemberg, Mohammad Tehranipoor

Proceedings of the 16th European Test Symposium, 2011

Multidimensional parametric test set optimization of wafer probe data for predicting in field failures and setting tighter test limits.

Dragoljub Gagi Drmanac, Nik Sumikawa, LeRoy Winemberg, Li-C. Wang, Magdy S. Abadir

Proceedings of the Design, Automation and Test in Europe, 2011

In-field aging measurement and calibration for power-performance optimization.

Shuo Wang, Mohammad Tehranipoor, LeRoy Winemberg

Proceedings of the 48th Design Automation Conference, 2011

2010

Detecting and diagnosing open defects.

Dat Tran, LeRoy Winemberg, Darrell Carder, Xijiang Lin, Joe LeBritton, Bruce Swanson

Proceedings of the 2011 IEEE International Test Conference, 2010

2005

Outsourcing DFT: it can be done but it isn't easy.

LeRoy Winemberg

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005