Leonidas Katselas

According to our database, Leonidas Katselas authored at least 6 papers between 2015 and 2024.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2024

11.3 Metis AIPU: A 12nm 15TOPS/W 209.6TOPS SoC for Cost- and Energy-Efficient Inference at the Edge.

Pascal Alexander Hager, Bert Moons, Stefan Cosemans, Ioannis A. Papistas, Bram Rooseleer, Jeroen Van Loon, Roel Uytterhoeven, Florian Zaruba, Spyridoula Koumousi, Milos Stanisavljevic, Stefan Mach, Sebastiaan Mutsaards, Riduan Khaddam Aljameh, Gua Hao Khov, Brecht Machiels, Cristian Olar, Anastasios Psarras, Sander Geursen, Jeroen Vermeeren, Yi Lu, Abhishek Maringanti, Deepak Ameta, Leonidas Katselas, Noah Hütter, Manuel Schmuck, Swetha Sivadas, Karishma Sharma, Manuel Oliveira, Ramon Aerne, Nitish Sharma, Timir Soni, Beatrice Bussolino, Djordje Pesut, Michele Pallaro, Andrei Podlesnii, Alexios Lyrakis, Yannick Ruffiner, Martino Dazzi, Johannes Thiele, Koen Goetschalckx, Nazareno Bruschi, Jonas Doevenspeck, Bram Verhoef, Stefan Linz, Giuseppe Garcea, Jonathan Ferguson, Ioannis Koltsidas, Evangelos Eleftheriou

Proceedings of the IEEE International Solid-State Circuits Conference, 2024

2022

Testing Embedded Toggle Generation Through On-Chip IR-Drop Measurements.

Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Takuji Miki, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

IEEE Des. Test, 2022

2021

Testing Embedded Toggle Pattern Generation Through On-Chip IR Drop Monitoring.

Kazuki Monta, Leonidas Katselas, Ferenc Fodor, Alkis A. Hatzopoulos, Makoto Nagata, Erik Jan Marinissen

Proceedings of the 26th IEEE European Test Symposium, 2021

2018

On-Chip Toggle Generators to Provide Realistic Conditions during Test of Digital 2D-SoCs and 3D-SICs.

Leonidas Katselas, Alkis A. Hatzopoulos, Hailong Jiao, Christos Papameletis, Erik Jan Marinissen

Proceedings of the IEEE International Test Conference, 2018

2017

Embedded toggle generator to control the switching activity during test of digital 2D-SoCs and 3D-SICs.

Leonidas Katselas, Hailong Jiao, Angelos Athanasiadis, Christos Papameletis, Alkis A. Hatzopoulos, Erik Jan Marinissen

Proceedings of the 27th International Symposium on Power and Timing Modeling, 2017

2015

Fault modeling and testing of through silicon via interconnections.

Vasileios Gerakis, Leonidas Katselas, Alkis A. Hatzopoulos

Proceedings of the 21st IEEE International On-Line Testing Symposium, 2015