Unlocking the Potential of Information Modeling for Root Cause Analysis in a Production Environment: A Comprehensive State-of-the-Art Review Using the Kitchenham Methodology.

[BibT_eX]

[DOI]

Leonid Koval

Simon Knollmeyer

IEEE Access, 2024

Automatized End Mill Wear Inspection Using a Novel Illumination Unit and Convolutional Neural Network.

[BibT_eX]

[DOI]

IEEE Access, 2024

A Conceptual Framework for Addressing Class Imbalance in Image Data: Challenges and Strategies.

[BibT_eX]

[DOI]

Proceedings of the 12th IEEE International Conference on Intelligent Systems, 2024

Addressing the Complexity of AI Integration in Manufacturing: A Morphological Analysis.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

Document Knowledge Graph to Enhance Question Answering with Retrieval Augmented Generation.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

Supervised Anomaly Detection for Production Line Images using Data Augmentation and Convolutional Neural Network.

[BibT_eX]

[DOI]

Proceedings of the 29th IEEE International Conference on Emerging Technologies and Factory Automation, 2024

2022

High Resolution Mask R-CNN-based Damage Detection on Titanium Nitride Coated Milling Tools for Condition Monitoring by using a New Illumination Technique.

[BibT_eX]

[DOI]

Proceedings of the 17th International Joint Conference on Computer Vision, 2022

2021