Leonardo Heitich Brendler
Orcid: 0000-0002-8055-9597Affiliations:
- Universidade Federal do Rio Grande do Sul, Porto Alegre, Brazil
According to our database1,
Leonardo Heitich Brendler
authored at least 15 papers
between 2018 and 2023.
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Bibliography
2023
A Proof-of-Concept of a Multiple-Cell Upsets Detection Method for SRAMs in Space Applications.
IEEE Trans. Circuits Syst. I Regul. Pap., December, 2023
Proceedings of the 36th SBC/SBMicro/IEEE/ACM Symposium on Integrated Circuits and Systems Design, 2023
Proceedings of the IEEE Computer Society Annual Symposium on VLSI, 2023
Impact on Radiation Robustness of Gate Mapping in FinFET Circuits under Work-function Fluctuation.
Proceedings of the IEEE International Symposium on Circuits and Systems, 2023
Proceedings of the 30th IEEE International Conference on Electronics, Circuits and Systems, 2023
2021
Exploring Gate Mapping and Transistor Sizing to Improve Radiation Robustness: A C17 Benchmark Case-study.
Proceedings of the 22nd IEEE Latin American Test Symposium, 2021
Voltage Scaling Influence on the Soft Error Susceptibility of a FinFET-based Circuit.
Proceedings of the 12th IEEE Latin America Symposium on Circuits and System, 2021
2020
IEEE Trans. Circuits Syst. I Regul. Pap., 2020
Proceedings of the IEEE Latin-American Test Symposium, 2020
Work-Function Fluctuation Impact on the SET Response of FinFET-based Majority Voters.
Proceedings of the IEEE Latin-American Test Symposium, 2020
2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the 27th IFIP/IEEE International Conference on Very Large Scale Integration, 2019
Proceedings of the VLSI-SoC: New Technology Enabler, 2019
2018
Evaluating the Impact of Process Variability and Radiation Effects on Different Transistor Arrangements.
Proceedings of the IFIP/IEEE International Conference on Very Large Scale Integration, 2018
Exploring Multi-level Design to Mitigate Variability and Radiation Effects on 7nm FinFET Logic Cells.
Proceedings of the 25th IEEE International Conference on Electronics, Circuits and Systems, 2018