Leonardo Bonet Zordan

According to our database, Leonardo Bonet Zordan authored at least 13 papers between 2011 and 2016.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2016

An effective BIST architecture for power-gating mechanisms in low-power SRAMs.

Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Leonardo Bonet Zordan

Proceedings of the 17th International Symposium on Quality Electronic Design, 2016

Design space exploration for complex automotive applications: an engine control system case study.

Khalid Latif, Manuel Selva, Charles Effiong, Roman Ursu, Abdoulaye Gamatié, Gilles Sassatelli, Leonardo Bonet Zordan, Luciano Ost, Piotr Dziurzanski, Leandro Soares Indrusiak

Proceedings of the 2016 Workshop on Rapid Simulation and Performance Evaluation, 2016

Failure mechanisms and test methods for the SRAM TVC write-assist technique.

Josef Kinseher, Moritz Völker, Leonardo Bonet Zordan, Ilia Polian

Proceedings of the 21th IEEE European Test Symposium, 2016

Improving SRAM test quality by leveraging self-timed circuits.

Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian, Andreas Leininger

Proceedings of the 2016 Design, Automation & Test in Europe Conference & Exhibition, 2016

2015

On the Use of Assist Circuits for Improved Coupling Fault Detection in SRAMs.

Josef Kinseher, Leonardo Bonet Zordan, Ilia Polian

Proceedings of the 24th IEEE Asian Test Symposium, 2015

2014

On the Test and Mitigation of Malfunctions in Low-Power SRAMs.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Arnaud Virazel, Nabil Badereddine

J. Electron. Test., 2014

2013

A built-in scheme for testing and repairing voltage regulators of low-power srams.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the 31st IEEE VLSI Test Symposium, 2013

On the reuse of read and write assist circuits to improve test efficiency in low-power SRAMs.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the 2013 IEEE International Test Conference, 2013

Test solution for data retention faults in low-power SRAMs.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the Design, Automation and Test in Europe, 2013

2012

Low-power SRAMs power mode control logic: Failure analysis and test solutions.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the 2012 IEEE International Test Conference, 2012

Defect analysis in power mode control logic of low-power SRAMs.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the 17th IEEE European Test Symposium, 2012

2011

Optimized march test flow for detecting memory faults in SRAM devices under bit line coupling.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Arnaud Virazel, Nabil Badereddine

Proceedings of the 14th IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2011

Failure Analysis and Test Solutions for Low-Power SRAMs.

Leonardo Bonet Zordan, Alberto Bosio, Luigi Dilillo, Patrick Girard, Serge Pravossoudovitch, Aida Todri, Arnaud Virazel, Nabil Badereddine

Proceedings of the 20th IEEE Asian Test Symposium, 2011