Leon van de Logt

According to our database, Leon van de Logt authored at least 5 papers between 2003 and 2019.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2019

Model-driven AMS Test Setup Validation Tool prepared for IEEE P1687.2.

Leon M. A. van de Logt, Vladimir A. Zivkovic, Ingrid H. A. van Baast

Proceedings of the 24th IEEE European Test Symposium, 2019

Analog Test Interface for IEEE 1687 Employing Split SAR Architecture to Support Embedded Instrument Dependability Applications.

Jerrin Pathrose, Leon van de Logt, Hans G. Kerkhoff

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2007

Variance Reduction for Supply Ramp Based Cheap RF Test Alternatives.

Shaji Krishnan, Rene Jonker, Leon van de Logt

Proceedings of the 12th European Test Symposium, 2007

2003

An extension to JTAG for at-speed debug on a system.

Leon van de Logt, Frank van der Heyden, Tom Waayers

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

IEEE P1581: To Live or Let die?

Frans G. M. de Jong, Leon van de Logt

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003