Leen Van Doorselaer

According to our database, Leen Van Doorselaer authored at least 2 papers between 2023 and 2024.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2024

Unsupervised anomaly detection for pome fruit quality inspection using X-ray radiography.

Astrid Tempelaere, Jiaqi He, Leen Van Doorselaer, Pieter Verboven, Bart M. Nicolaï, Mario Valerio Giuffrida

Comput. Electron. Agric., 2024

2023

Deep Learning for Apple Fruit Quality Inspection using X-Ray Imaging.

Astrid Tempelaere, Leen Van Doorselaer, Jiaqi He, Pieter Verboven, Tinne Tuytelaars, Bart M. Nicolaï

Proceedings of the IEEE/CVF International Conference on Computer Vision, 2023