Lee Song
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Bibliography
2002
A Successful DFT Tester: What Will It Look Like? Is Revolution in Test Approaches Required?
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
A Successful DFT Tester: What Will It Look Like? Is DFT Tester a Logical Next Step in ATE Evolution?
Proceedings of the 20th IEEE VLSI Test Symposium (VTS 2002), Without Testing It's a Gamble, 28 April, 2002
valuating ATE Features in Terms of Test Escape Rates and Other Cost of Test Culprits.
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002