Lee-Ing Tong

According to our database, Lee-Ing Tong authored at least 12 papers between 2001 and 2013.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2013

Monitoring the software development process using a short-run control chart.

Chih-Wei Chang, Lee-Ing Tong

Softw. Qual. J., 2013

2012

Bi-criteria minimization for the permutation flowshop scheduling problem with machine-based learning effects.

Yu-Hsiang Chung, Lee-Ing Tong

Comput. Ind. Eng., 2012

2011

Forecasting time series using a methodology based on autoregressive integrated moving average and genetic programming.

Yi-Shian Lee, Lee-Ing Tong

Knowl. Based Syst., 2011

Determining the optimal re-sampling strategy for a classification model with imbalanced data using design of experiments and response surface methodologies.

Lee-Ing Tong, Yung-Chia Chang, Shan-Hui Lin

Expert Syst. Appl., 2011

2009

Wafer defect pattern recognition by multi-class support vector machines by using a novel defect cluster index.

Li-Chang Chao, Lee-Ing Tong

Expert Syst. Appl., 2009

2008

Robust design for multiple dynamic quality characteristics using data envelopment analysis.

Lee-Ing Tong, Chung-Ho Wang, Chih-Wei Tsai

Qual. Reliab. Eng. Int., 2008

Novel yield model for integrated circuits with clustered defects.

Lee-Ing Tong, Li-Chang Chao

Expert Syst. Appl., 2008

2007

The application of control chart for defects and defect clustering in IC manufacturing based on fuzzy theory.

Kun-Lin Hsieh, Lee-Ing Tong, Min-Chia Wang

Expert Syst. Appl., 2007

2005

An innovative model of multi-project wafer service in the foundry industry.

Tai-Yih Yang, Lee-Ing Tong, Benjamin J. C. Yuan

Int. J. Technol. Manag., 2005

Optimization of a multi-response problem in Taguchi's dynamic system.

Kun-Lin Hsieh, Lee-Ing Tong, Hung-Pin Chiu, Hsin-Ya Yeh

Comput. Ind. Eng., 2005

2004

Dynamic multiple responses by ideal solution analysis.

Lee-Ing Tong, Chung-Ho Wang, Chih-Chien Chen, Chun-Tzu Chen

Eur. J. Oper. Res., 2004

2001

Optimization of multiple quality responses involving qualitative and quantitative characteristics in IC manufacturing using neural networks.

Kun-Lin Hsieh, Lee-Ing Tong

Comput. Ind., 2001