Le Jin

According to our database, Le Jin authored at least 31 papers between 2003 and 2023.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of three.

2023

A FPGA-Based Iterative 6DoF Pose Refinement Processing Unit for Fast and Energy-Efficient Pose Estimation in Picking Robots.

Teng Zhang, Minghui Yang, Le Jin, Guoshun Zhou, Xuefeng Zhao, Chao Shi, Xingyu Yuan, Liang Zhou, Liang Chang, Jun Zhou

Proceedings of the 49th Annual Conference of the IEEE Industrial Electronics Society, 2023

PM-Blade: A Persistent Memory Augmented LSM-tree Storage for Database.

Yinan Zhang, Huiqi Hu, Xuan Zhou, Enlong Xie, Hongdi Ren, Le Jin

Proceedings of the 39th IEEE International Conference on Data Engineering, 2023

2012

Testing ADC Spectral Performance Without Dedicated Data Acquisition.

Jingbo Duan, Le Jin, Degang Chen

IEEE Trans. Instrum. Meas., 2012

2011

Application of the Kalman Filter in Linearity Testing of Analog-to-Digital Converters.

Le Jin

J. Electron. Test., 2011

2010

A power-of-two FFT algorithm and structure for DRM receiver.

Le Jin, Lin Liang

IEEE Trans. Consumer Electron., 2010

A new method for estimating spectral performance of ADC from INL.

Jingbo Duan, Le Jin, Degang Chen

Proceedings of the 2011 IEEE International Test Conference, 2010

INL based dynamic performance estimation for ADC BIST.

Jingbo Duan, Le Jin, Degang Chen

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2010), May 30, 2010

2009

Code-Density Test of Analog-to-Digital Converters Using Single Low-Linearity Stimulus Signal.

Le Jin, Degang Chen, Randall L. Geiger

IEEE Trans. Instrum. Meas., 2009

Testing of High Resolution ADCs Using Lower Resolution DACs via Iterative Transfer Function Estimation.

Sehun Kook, Vishwanath Natarajan, Abhijit Chatterjee, Shalabh Goyal, Le Jin

Proceedings of the 14th IEEE European Test Symposium, 2009

Grey Synthetical Prediction Model of Military Logistics Based on Evolutionary Neural Network.

Jin Yu, Limin Zhi, Yunming Qiu, Le Jin, Hailu Du

Proceedings of the Second International Joint Conference on Computational Sciences and Optimization, 2009

Low Cost Dynamic Test Methodology for High Precision ΣD ADCs.

Sehun Kook, Hyun Woo Choi, Vishwanath Natarajan, Abhijit Chatterjee, Alfred V. Gomes, Shalabh Goyal, Le Jin

Proceedings of the Eighteentgh Asian Test Symposium, 2009

2008

Testing of Precision DAC Using Low-Resolution ADC With Wobbling.

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen

IEEE Trans. Instrum. Meas., 2008

Dynamic Network Selection for Multicast Services in Wireless Cooperative Networks.

Liang Chen, Le Jin, Feng He, Hanwen Cheng, Lenan Wu

IEICE Trans. Commun., 2008

Linearity Test Time Reduction for Analog-to-Digital Converters Using the Kalman Filter with Experimental Parameter Estimation.

Le Jin

Proceedings of the 2008 IEEE International Test Conference, 2008

System identification -based reduced-code testing for pipeline ADCs' linearity test.

Hanqing Xing, Degang Chen, Randall L. Geiger, Le Jin

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2008), 2008

2007

SEIR Linearity Testing of Precision A/D Converters in Nonstationary Environments With Center-Symmetric Interleaving.

Le Jin, Degang Chen, Randall L. Geiger

IEEE Trans. Instrum. Meas., 2007

Robust High-Gain Amplifier Design Using Dynamical Systems and Bifurcation Theory With Digital Postprocessing Techniques.

Chengming He, Le Jin, Degang Chen, Randy Geiger

IEEE Trans. Circuits Syst. I Regul. Pap., 2007

2006

Testing of Precision DACs Using Low-Resolution ADCs with Dithering.

Le Jin, Hosam Haggag, Randall L. Geiger, Degang Chen

Proceedings of the 2006 IEEE International Test Conference, 2006

Linearity Test of Analog-to-Digital Converters Using Kalman Filtering.

Le Jin, Degang Chen, Randall L. Geiger

Proceedings of the 2006 IEEE International Test Conference, 2006

Characterization of a current-mode bandgap circuit structure for high-precision reference applications.

Hanqing Xing, Le Jin, Degang Chen, Randall L. Geiger

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

A self-calibrated bandgap voltage reference with 0.5 ppm/°C temperature coefficient.

Le Jin, Hanqing Xing, Degang Chen, Randall L. Geiger

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2006), 2006

2005

Accurate testing of analog-to-digital converters using low linearity signals with stimulus error identification and removal.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger

IEEE Trans. Instrum. Meas., 2005

High-performance ADC linearity test using low-precision signals in non-stationary environments.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Randall L. Geiger, Degang Chen

Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005

A test strategy for time-to-digital converters using dynamic element matching and dithering.

Wenbo Liu, Hanqing Xing, Le Jin, Randall L. Geiger, Degang Chen

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

A digital self-calibration algorithm for ADCs based on histogram test using low-linearity input signals.

Le Jin, Degang Chen, Randall L. Geiger

Proceedings of the International Symposium on Circuits and Systems (ISCAS 2005), 2005

2004

Fast implementation of a linearity test approach for high-resolution ADCs using non-linear ramp signals.

Le Jin, Chengming He, Degang Chen, Randall L. Geiger

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

An SoC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli.

Le Jin, Chengming He, Degang Chen, Randall L. Geiger

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

Robust design of high gain amplifiers using dynamical systems and bifurcation theory.

Chengming He, Le Jin, Degang Chen, Randall L. Geiger

Proceedings of the 2004 International Symposium on Circuits and Systems, 2004

2003

BIST and production testing of ADCs using imprecise stimulus.

Kumar L. Parthasarathy, Turker Kuyel, Dana Price, Le Jin, Degang Chen, Randall L. Geiger

ACM Trans. Design Autom. Electr. Syst., 2003

Linearity Testing of Precision Analog-to-Digital Converters Using Stationary Nonlinear Inputs.

Le Jin, Kumar L. Parthasarathy, Turker Kuyel, Degang Chen, Randall L. Geiger

Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003

Experimental evaluation and validation of a BIST algorithm for characterization of A/D converter performance.

Kumar L. Parthasarathy, Le Jin, Turker Kuyel, Dana Price, Degang Chen, Randall L. Geiger

Proceedings of the 2003 International Symposium on Circuits and Systems, 2003