Laurent Maingault

Orcid: 0000-0002-2984-5803

According to our database1, Laurent Maingault authored at least 9 papers between 2017 and 2024.

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Bibliography

2024
Enhancing Side-Channel Attacks Through X-Ray-Induced Leakage Amplification.
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2024

2023
An end-to-end approach to identify and exploit multi-fault injection vulnerabilities on microcontrollers.
J. Cryptogr. Eng., June, 2023

Ray-Spect: Local Parametric Degradation for Secure Designs: An application to X-Ray Fault Injection.
Proceedings of the 29th International Symposium on On-Line Testing and Robust System Design, 2023

X ray nanoprobe for fault attacks and circuit edits on 28-nm integrated circuits.
Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2021
Fast Calibration of Fault Injection Equipment with Hyperparameter Optimization Techniques.
Proceedings of the Smart Card Research and Advanced Applications, 2021

Laboratory X-rays Operando Single Bit Attacks on Flash Memory Cells.
Proceedings of the Smart Card Research and Advanced Applications, 2021

2020
Deep Learning Side-Channel Analysis on Large-Scale Traces - A Case Study on a Polymorphic AES.
IACR Cryptol. ePrint Arch., 2020

An End-to-End Approach for Multi-Fault Attack Vulnerability Assessment.
Proceedings of the 17th Workshop on Fault Detection and Tolerance in Cryptography, 2020

2017
Nanofocused X-Ray Beam to Reprogram Secure Circuits.
Proceedings of the Cryptographic Hardware and Embedded Systems - CHES 2017, 2017


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