Laurent Escotte

According to our database, Laurent Escotte authored at least 6 papers between 1999 and 2011.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2011

Long-term stability of an SiGe HBT-based active cold load.

Emilie Leynia de la Jarrige, Laurent Escotte, Eric Gonneau, Jean-Marc Goutoule

Proceedings of the 2011 IEEE International Geoscience and Remote Sensing Symposium, 2011

2007

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.

Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères

Microelectron. Reliab., 2007

Long-term reliability of silicon bipolar transistors subjected to low constraints.

A. Crosson, Laurent Escotte, Marise Bafleur, D. Talbourdet, L. Crétinon, Philippe Perdu, Guy Perez

Microelectron. Reliab., 2007

2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas

Microelectron. Reliab., 2004

2003

On-wafer noise characterization of low-noise amplifiers in the Ka-band.

Sabine Long, Laurent Escotte, Jacques Graffeuil, F. Brasseau, J. L. Cazaux

IEEE Trans. Instrum. Meas., 2003

1999

A cost-effective technique for extending the low-frequency range of a microwave noise parameter test set.

Laurent Escotte, Jean-Guy Tartarin, Jacques Graffeuil

IEEE Trans. Instrum. Meas., 1999