Laurent Béchou
According to our database1,
Laurent Béchou
authored at least 21 papers
between 2002 and 2018.
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Collaborative distances:
Timeline
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Bibliography
2018
Highlighting two integration technologies based on vias: Through silicon vias and embedded components into PCB. Strengths and weaknesses for manufacturing and reliability.
Microelectron. Reliab., 2018
2017
Microelectron. Reliab., 2017
2015
Correlation between forward-reverse low-frequency noise and atypical I-V signatures in 980 nm high-power laser diodes.
Microelectron. Reliab., 2015
Investigations on electro-optical and thermal performances degradation of high power density GaAs-based laser diode in vacuum environment.
Microelectron. Reliab., 2015
Photothermal activated failure mechanism in polymer-based packaging of low power InGaN/GaN MQW LED under active storage.
Microelectron. Reliab., 2015
2013
Saint-Venant's principle and the minimum length of a dual-coated optical fiber specimen in reliability (proof) testing.
Microelectron. Reliab., 2013
Durability study of a fluorescent optical memory in glass studied by luminescence spectroscopy.
Microelectron. Reliab., 2013
2011
An original DoE-based tool for silicon photodetectors EoL estimation in space environments.
Microelectron. Reliab., 2011
2010
Strain estimation in III-V materials by analysis of the degree of polarization of luminescence.
Microelectron. Reliab., 2010
Effects of silicone coating degradation on GaN MQW LEDs performances using physical and chemical analyses.
Microelectron. Reliab., 2010
2008
Selective activation of failure mechanisms in packaged double-heterostructure light emitting diodes using controlled neutron energy irradiation.
Microelectron. Reliab., 2008
Reliability investigations of 850 nm silicon photodiodes under proton irradiation for space applications.
Microelectron. Reliab., 2008
2006
Microelectron. Reliab., 2006
2005
Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier.
Microelectron. Reliab., 2005
2004
Study of influence of failure modes on lifetime distribution prediction of 1.55 μm DFB Laser diodes using weak drift of monitored parameters during ageing tests.
Microelectron. Reliab., 2004
2003
An improved method for automatic detection and location of defects in electronic components using scanning ultrasonic microscopy.
IEEE Trans. Instrum. Meas., 2003
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectron. Reliab., 2003
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectron. Reliab., 2003
Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations.
Microelectron. Reliab., 2003
2002
Behavioral study of passive components and coating materials under isostatic pressure and temperature stress conditions.
Microelectron. Reliab., 2002
Acoustic analysis of an assembly: Structural identification by signal processing (wavelets).
Microelectron. Reliab., 2002