Laurent Bary

According to our database, Laurent Bary authored at least 6 papers between 2004 and 2008.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2008

Advanced Low-Noise X-Ray Readout ASIC for Radiation Sensor Interfaces.

Thomas Noulis, Stylianos Siskos, Gérard Sarrabayrouse, Laurent Bary

IEEE Trans. Circuits Syst. I Regul. Pap., 2008

2007

Electrostatic discharge failure analysis of capacitive RF MEMS switches.

Jinyu Jason Ruan, Nicolas Nolhier, Marise Bafleur, Laurent Bary, Fabio Coccetti, T. Lisec, Robert Plana

Microelectron. Reliab., 2007

Identification of the physical signatures of CDM induced latent defects into a DC-DC converter using low frequency noise measurements.

Yuan Gao, Nicolas Guitard, Christophe Salamero, Marise Bafleur, Laurent Bary, Laurent Escotte, Patrick Gueulle, Lionel Lescouzères

Microelectron. Reliab., 2007

2005

Failure predictive model of capacitive RF-MEMS.

S. Mellé, D. De Conto, L. Mazenq, David Dubuc, B. Poussard, C. Bordas, Katja Grenier, Laurent Bary, Olivier Vendier, J. L. Muraro

Microelectron. Reliab., 2005

2004

Low Frequency Noise Measurements for ESD Latent Defect Detection in High Reliability Applications.

Nicolas Guitard, David Trémouilles, Marise Bafleur, Laurent Escotte, Laurent Bary, Philippe Perdu, Gérard Sarrabayrouse, Nicolas Nolhier, Roberto Reyna-Rojas

Microelectron. Reliab., 2004

Smart MEMS concept for high secure RF and millimeterwave communications.

David Dubuc, M. Saddaoui, S. Mellé, F. Flourens, L. Rabbia, Benoit Ducarouge, Katja Grenier, Patrick Pons, Ali Boukabache, Laurent Bary

Microelectron. Reliab., 2004