Larg Weiland

According to our database, Larg Weiland authored at least 2 papers between 1998 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

In-Product BTI Aging Sensor for Reliability Screening and Early Detection of Material at Risk.

Tomasz Brozek, Alberto A. P. Cattaneo, Larg Weiland, Michele Quarantelli, Alberto Coccoli, Sharad Saxena, Christopher Hess, Andrzej J. Strojwas

Proceedings of the IEEE International Reliability Physics Symposium, 2023

1998

Prozeßbegleitende Bestimmung von Defektdichten in hochintegrierten Schaltungen

Larg Weiland

PhD thesis, 1998