Lakshmi Ramakrishnan

According to our database, Lakshmi Ramakrishnan authored at least 5 papers between 2019 and 2021.

Collaborative distances:

• Dijkstra number of four.
• Erdős number of four.

2021

Amazon SageMaker Debugger: A System for Real-Time Insights into Machine Learning Model Training.

Nathalie Rauschmayr, Vikas Kumar, Rahul Huilgol, Andrea Olgiati, Satadal Bhattacharjee, Nihal Harish, Vandana Kannan, Amol Lele, Anirudh Acharya, Jared Nielsen, Lakshmi Ramakrishnan, Ishan Bhatt, Kohen Chia, Neelesh Dodda, Zhihan Li, Jiacheng Gu, Miyoung Choi, Balajee Nagarajan, Jeffrey Geevarghese, Denis Davydenko, Sifei Li, Lu Huang, Edward Kim, Tyler Hill, Krishnaram Kenthapadi

Proceedings of the Fourth Conference on Machine Learning and Systems, 2021

Low Power Shift and Capture through ATPG-Configured Embedded Enable Capture Bits.

Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Jennifer Dworak, Kundan Nepal, Theodore W. Manikas, R. Iris Bahar

Proceedings of the IEEE International Test Conference, 2021

2020

Amazon SageMaker Autopilot: a white box AutoML solution at scale.

Piali Das, Nikita Ivkin, Tanya Bansal, Laurence Rouesnel, Philip Gautier, Zohar S. Karnin, Leo Dirac, Lakshmi Ramakrishnan, Andre Perunicic, Iaroslav Shcherbatyi, Wilton Wu, Aida Zolic, Huibin Shen, Amr Ahmed, Fela Winkelmolen, Miroslav Miladinovic, Cédric Archambeau, Alex Tang, Bhaskar Dutt, Patricia Grao, Kumar Venkateswar

Proceedings of the Fourth Workshop on Data Management for End-To-End Machine Learning, 2020

2019

Innovate Practices on CyberSecurity of Hardware Semiconductor Devices.

Alfred L. Crouch, Peter L. Levin, Jennifer Dworak, Lakshmi Ramakrishnan, Yuhe Xia, Chi Zhang, Daniel Engels, Gary Evans, Ping Gui, Scott McWilliams, Saurabh Gupta, Franco Stellari, Naigang Wang, Peilin Song

Proceedings of the 37th IEEE VLSI Test Symposium, 2019

Test Architecture for Fine Grained Capture Power Reduction.

Yi Sun, Hui Jiang, Lakshmi Ramakrishnan, Matan Segal, Kundan Nepal, Jennifer Dworak, Theodore W. Manikas, R. Iris Bahar

Proceedings of the 26th IEEE International Conference on Electronics, Circuits and Systems, 2019