Lakshmi N. Reddy
Orcid: 0000-0002-0482-1645
According to our database1,
Lakshmi N. Reddy
authored at least 26 papers
between 1991 and 2022.
Collaborative distances:
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Bibliography
2022
Design Rule Violation Prediction at Sub-10-nm Process Nodes Using Customized Convolutional Networks.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022
Design Flow Parameter Optimization with Multi-Phase Positive Nondeterministic Tuning.
Proceedings of the ISPD 2022: International Symposium on Physical Design, Virtual Event, Canada, March 27, 2022
2021
Proceedings of the IEEE/ACM International Conference On Computer Aided Design, 2021
2020
DRC Hotspot Prediction at Sub-10nm Process Nodes Using Customized Convolutional Network.
Proceedings of the ISPD 2020: International Symposium on Physical Design, Taipei, Taiwan, March 29, 2020
2018
OWARU: Free Space-Aware Timing-Driven Incremental Placement With Critical Path Smoothing.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proceedings of the 2018 International Symposium on Physical Design, 2018
2016
Proceedings of the 29th International Conference on VLSI Design and 15th International Conference on Embedded Systems, 2016
Proceedings of the 17th International Symposium on Quality Electronic Design, 2016
Proceedings of the 35th International Conference on Computer-Aided Design, 2016
2014
ACM Trans. Design Autom. Electr. Syst., 2014
2013
Proceedings of the IEEE/ACM International Conference on Computer-Aided Design, 2013
Proceedings of the Design, Automation and Test in Europe, 2013
2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
2011
2010
Proceedings of the 2010 International Symposium on Physical Design, 2010
2008
Proceedings of the Handbook of Algorithms for Physical Design Automation., 2008
2004
IEEE Des. Test Comput., 2004
2000
1999
Proceedings of the IEEE International Conference On Computer Design, 1999
1996
1993
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1993
1992
Proceedings of the Proceedings IEEE International Test Conference 1992, 1992
COMPACTEST-II: a method to generate compact two-pattern test sets for combinational logic circuits.
Proceedings of the 1992 IEEE/ACM International Conference on Computer-Aided Design, 1992
Proceedings of the conference on European design automation, 1992
1991
Proceedings of the Proceedings IEEE International Test Conference 1991, 1991
Increasing Fault Coverage for Synchronous Sequential Circuits by the Multiple Observation Time Test Strategy.
Proceedings of the 1991 IEEE/ACM International Conference on Computer-Aided Design, 1991