Laiqiang Luo

According to our database, Laiqiang Luo authored at least 1 paper in 2020.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2020

Reliability and Breakdown Study of Erase Gate Oxide in Split-Gate Non-Volatile Memory Device.

Laiqiang Luo, Kalya Shubhakar, Sen Mei, Nagarajan Raghavan, Fan Zhang, Danny Shum, Kin Leong Pey

Proceedings of the 2020 IEEE International Reliability Physics Symposium, 2020