L. Théolier
Orcid: 0000-0002-6149-1849
According to our database1,
L. Théolier
authored at least 9 papers
between 2008 and 2018.
Collaborative distances:
Collaborative distances:
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Bibliography
2018
Effect of HTRB lifetest on AlGaN/GaN HEMTs under different voltages and temperatures stresses.
Microelectron. Reliab., 2018
Proceedings of the IEEE International Reliability Physics Symposium, 2018
2017
Lifetime of power electronics interconnections in accelerated test conditions: High temperature storage and thermal cycling.
Microelectron. Reliab., 2017
2016
Power electronic assemblies: Thermo-mechanical degradations of gold-tin solder for attaching devices.
Microelectron. Reliab., 2016
2015
Identification and analysis of power substrates degradations subjected to severe aging tests.
Microelectron. Reliab., 2015
Microelectron. Reliab., 2015
Mechanical stress investigation after technological process in Deep Trench Termination DT<sup>2</sup> using BenzoCycloButene as dielectric material.
Microelectron. Reliab., 2015
2013
Electrical characterization under mechanical stress at various temperatures of PiN power diodes in a health monitoring approach.
Microelectron. Reliab., 2013
2008