L. Pu

According to our database, L. Pu authored at least 2 papers between 2003 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Extended MTJ TDDB Model, and Improved STT-MRAM Reliability With Reduced Circuit and Process Variabilities.

Vinayak Bharat Naik, J. H. Lim, Kazutaka Yamane, J. Kwon, Behin-Aein B., N. L. Chung, S. K, R. Chao, C. Chiang, Y. Huang, L. Pu, Yuichi Otani, Suk Hee Jang, Nivetha Balasankaran, Wah-Peng Neo, T. Ling, Jia Wen Ting, Hongsik Yoon, Johannes Müller, Bert Pfefferling, Oliver Kallensee, Thomas Merbeth, Chim Seng Seet, J. Wong, Y. S. You, Steven Soss, T. H. Chan, S. Y. Siah

Proceedings of the IEEE International Reliability Physics Symposium, 2022

2003

Numerical investigation of characteristics of p-channel Ge/Si hetero-nanocrystal memory.

H. G. Yang, Yi Shi, L. Pu, S. L. Gu, B. Shen, P. Han, R. Zhang, Y. D. Zhang

Microelectron. J., 2003