L. Ludwig
According to our database1,
L. Ludwig
authored at least 2 papers
between 1999 and 2000.
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Bibliography
2000
Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications.
Neural Comput. Appl., 2000
1999
The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry.
Proceedings of the Third International Conference on Knowledge-Based Intelligent Information Engineering Systems, 1999