L. Ludwig

According to our database1, L. Ludwig authored at least 2 papers between 1999 and 2000.

Collaborative distances:
  • Dijkstra number2 of five.
  • Erdős number3 of four.

Timeline

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Links

On csauthors.net:

Bibliography

2000
Error Classification and Yield Prediction of Chips in Semiconductor Industry Applications.
Neural Comput. Appl., 2000

1999
The use of dARTMAP and fuzzy ARTMAP to solve the quality testing task in semiconductor industry.
Proceedings of the Third International Conference on Knowledge-Based Intelligent Information Engineering Systems, 1999


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