L. J. Balk

According to our database, L. J. Balk authored at least 7 papers between 2001 and 2010.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2010

Nanoscale thermally induced stress analysis by complementary Scanning Thermal Microscopy techniques.

M. Fakhri, A.-K. Geinzer, Ralf Heiderhoff, L. J. Balk

Microelectron. Reliab., 2010

2009

Finite element analyses assisted Scanning Joule Expansion Microscopy on interconnects for failure analysis and reliability investigations.

A.-K. Tiedemann, K. Kurz, M. Fakhri, Ralf Heiderhoff, J. C. H. Phang, L. J. Balk

Microelectron. Reliab., 2009

2008

Near-field detection of photon emission from silicon with 30 nm spatial resolution.

D. Isakov, A. A. B. Tio, T. Geinzer, J. C. H. Phang, Y. Zhang, L. J. Balk

Microelectron. Reliab., 2008

2007

Time resolved determination of electrical field distributions within dynamically biased power devices by spectral EBIC investigations.

A. Pugatschow, Ralf Heiderhoff, L. J. Balk

Microelectron. Reliab., 2007

2006

Editorial.

L. J. Balk, W. H. Gerling, E. Wolfgang

Microelectron. Reliab., 2006

2002

Investigation of Tunnel-Regenerated Multi-Active-Region Light-Emitting Diodes (TRMAR LED) by Scanning Thermal Microscopy (STHM).

T. H. Lee, X. Guo, G. D. Shen, Yuan Ji, G. H. Wang, J. Y. Du, X. Z. Wang, G. Gao, A. Altes, L. J. Balk

Microelectron. Reliab., 2002

2001

Analysis of high-power devices using proton beam induced charge microscopy.

M. Zmeck, J. C. H. Phang, Andrew Bettiol, T. Osipowicz, F. Watt, L. J. Balk, Franz-Josef Niedernostheide, Hans-Joachim Schulze, E. Falck, R. Barthelmess

Microelectron. Reliab., 2001