L. Hu
According to our database1,
L. Hu
authored at least 4 papers
between 2017 and 2022.
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Bibliography
2022
Accurate and Fast STT-MRAM Endurance Evaluation Using a Novel Metric for Asymmetric Bipolar Stress and Deep Learning.
Proceedings of the IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and Circuits 2022), 2022
2019
Proceedings of the Design, Automation & Test in Europe Conference & Exhibition, 2019
2017
Proceedings of the 23rd International Conference on Automation and Computing, 2017