L. Foro

According to our database1, L. Foro authored at least 2 papers between 2012 and 2013.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of four.

Timeline

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Links

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Bibliography

2013
Transient device simulation of neutron-induced failure in IGBT: A first step for developing a compact predictive model.
Microelectron. Reliab., 2013

2012
On the reliability assessment of trench fieldstop IGBT under atmospheric neutron spectrum.
Microelectron. Reliab., 2012


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