L. D. Chen

According to our database, L. D. Chen authored at least 2 papers between 2006 and 2015.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2015

Study of a new electromigration failure mechanism by novel test structure.

L. D. Chen, B. L. Lin, M.-H. Hsieh, C. W. Chang, J. S. Tsai, J. C. Peng, C. C. Chiu, Y.-H. Lee

Proceedings of the IEEE International Reliability Physics Symposium, 2015

2006

A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect.

Robin C. J. Wang, Chang-Chun Lee, L. D. Chen, Kenneth Wu, K. S. Chang-Liao

Microelectron. Reliab., 2006