L. D. Chen

According to our database1, L. D. Chen authored at least 2 papers between 2006 and 2015.

Collaborative distances:
  • Dijkstra number2 of six.
  • Erdős number3 of five.

Timeline

Legend:

Book 
In proceedings 
Article 
PhD thesis 
Dataset
Other 

Links

On csauthors.net:

Bibliography

2015
Study of a new electromigration failure mechanism by novel test structure.
Proceedings of the IEEE International Reliability Physics Symposium, 2015

2006
A study of Cu/Low-k stress-induced voiding at via bottom and its microstructure effect.
Microelectron. Reliab., 2006


  Loading...