Kyungmee O. Kim

According to our database, Kyungmee O. Kim authored at least 13 papers between 2004 and 2023.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2023

Reliability maximization of a load-sharing system without redundant components.

Kyungmee O. Kim, Seongjun Park, Yujin Hong

Qual. Reliab. Eng. Int., December, 2023

2018

Optimal allocation of reliability improvement target based on the failure risk and improvement cost.

Kyungmee O. Kim, Ming Jian Zuo

Reliab. Eng. Syst. Saf., 2018

General model for the risk priority number in failure mode and effects analysis.

Kyungmee O. Kim, Ming Jian Zuo

Reliab. Eng. Syst. Saf., 2018

2016

Derating design for optimizing reliability and cost with an application to liquid rocket engines.

Kyungmee O. Kim, Taeseong Roh, Jae-Woo Lee, Ming Jian Zuo

Reliab. Eng. Syst. Saf., 2016

2013

A new reliability allocation weight for reducing the occurrence of severe failure effects.

Kyungmee O. Kim, Yoonjung Yang, Ming Jian Zuo

Reliab. Eng. Syst. Saf., 2013

2012

Extending the Scope of Empirical Mode Decomposition by Smoothing.

Donghoh Kim, Kyungmee O. Kim, Hee-Seok Oh

EURASIP J. Adv. Signal Process., 2012

2011

Burn-in considering yield loss and reliability gain for integrated circuits.

Kyungmee O. Kim

Eur. J. Oper. Res., 2011

2009

Optimal burn-in for maximizing reliability of repairable non-series systems.

Kyungmee O. Kim, Way Kuo

Eur. J. Oper. Res., 2009

2008

Reliability functions estimated from commonly used yield models.

Kyungmee O. Kim, Hee-Seok Oh

Microelectron. Reliab., 2008

2007

Two fault classification methods for large systems when available data are limited.

Kyungmee O. Kim, Ming Jian Zuo

Reliab. Eng. Syst. Saf., 2007

2006

Relating integrated circuit yield and time-dependent reliability for various defect density distributions.

Kyungmee O. Kim

IEEE Trans. Reliab., 2006

2005

Some considerations on system burn-in.

Kyungmee O. Kim, W. Kuo

IEEE Trans. Reliab., 2005

2004

A relation model of gate oxide yield and reliability.

Kyungmee O. Kim, Way Kuo, Wen Luo

Microelectron. Reliab., 2004