Kyungjin Min

According to our database, Kyungjin Min authored at least 1 paper in 2005.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2005

ESD-Induced Internal Core Device Failure: New Failure Modes in System-on-Chip (SoC) Designs, invited.

Yoon Huh, Peter Bendix, Kyungjin Min, Jau-Wen Chen, Ravindra Narayan, Larry D. Johnson, Steven H. Voldman

Proceedings of the 5th IEEE International Workshop on System-on-Chip for Real-Time Applications (IWSOC 2005), 2005