Kun-Han Tsai
Orcid: 0000-0001-8919-8663
According to our database1,
Kun-Han Tsai
authored at least 72 papers
between 1997 and 2021.
Collaborative distances:
Collaborative distances:
Timeline
2000
2005
2010
2015
2020
0
1
2
3
4
5
6
7
8
9
10
2
1
2
2
2
3
1
1
1
1
1
1
2
3
1
1
3
4
3
6
3
5
2
2
2
6
2
3
3
1
2
Legend:
Book In proceedings Article PhD thesis Dataset OtherLinks
On csauthors.net:
Bibliography
2021
Proceedings of the 39th IEEE VLSI Test Symposium, 2021
2020
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Diagnosis of Intermittent Scan Chain Faults Through a Multistage Neural Network Reasoning Process.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2020
Proceedings of the IEEE International Test Conference, 2020
Proceedings of the IEEE International Test Conference in Asia, 2020
2019
Proceedings of the IEEE International Test Conference in Asia, 2019
Proceedings of the 28th IEEE Asian Test Symposium, 2019
Improving scan chain diagnostic accuracy using multi-stage artificial neural networks.
Proceedings of the 24th Asia and South Pacific Design Automation Conference, 2019
2018
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2018
Proceedings of the IEEE International Test Conference in Asia, 2018
2017
Proceedings of the 26th IEEE Asian Test Symposium, 2017
2016
IEEE Des. Test, 2016
IEEE Des. Test, 2016
Proceedings of the 2016 IEEE International Test Conference, 2016
Proceedings of the International Conference on High Performance Computing & Simulation, 2016
Proceedings of the 21th IEEE European Test Symposium, 2016
2015
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Nonintrusive On-Line Transition-Time Binning and Timing Failure Threat Detection for Die-to-Die Interconnects.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2015
Proceedings of the VLSI Design, Automation and Test, 2015
Proceedings of the VLSI Design, Automation and Test, 2015
Proceedings of the 2015 IEEE International Test Conference, 2015
Feedback-bus oscillation ring: a general architecture for delay characterization and test of interconnects.
Proceedings of the 2015 Design, Automation & Test in Europe Conference & Exhibition, 2015
2014
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
Parametric Fault Testing and Performance Characterization of Post-Bond Interposer Wires in 2.5-D ICs.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2014
On-the-fly timing-aware built-in self-repair for high-speed interposer wires in 2.5-D ICs.
Proceedings of the 19th IEEE European Test Symposium, 2014
Testability-Driven Fault Sampling for Deterministic Test Coverage Estimation of Large Designs.
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
Proceedings of the 23rd IEEE Asian Test Symposium, 2014
2013
Parametric Delay Test of Post-Bond Through-Silicon Vias in 3-D ICs via Variable Output Thresholding Analysis.
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2013
Proceedings of the 2013 International Symposium on VLSI Design, Automation, and Test, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 2013 IEEE International Test Conference, 2013
Proceedings of the 2013 IEEE 19th International On-Line Testing Symposium (IOLTS), 2013
Proceedings of the 22nd Asian Test Symposium, 2013
2012
Proceedings of the 2012 IEEE International Test Conference, 2012
Proceedings of the 49th Annual Design Automation Conference 2012, 2012
Proceedings of the 21st IEEE Asian Test Symposium, 2012
2010
Proceedings of the 2011 IEEE International Test Conference, 2010
Proceedings of the 2010 International Conference on Computer-Aided Design, 2010
A Low Complexity Transmitter Architecture and Its Application to PAPR Reduction in SFBC MIMO-OFDM Systems.
Proceedings of IEEE International Conference on Communications, 2010
Proceedings of the 15th European Test Symposium, 2010
Improved weight assignment for logic switching activity during at-speed test pattern generation.
Proceedings of the 15th Asia South Pacific Design Automation Conference, 2010
2009
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2009
Proceedings of the 14th IEEE European Test Symposium, 2009
Proceedings of the Eighteentgh Asian Test Symposium, 2009
2008
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008
Proceedings of the 17th IEEE Asian Test Symposium, 2008
2007
Proceedings of the 2007 IEEE International Test Conference, 2007
Proceedings of the 44th Design Automation Conference, 2007
2006
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2006
Proceedings of the 24th IEEE VLSI Test Symposium (VTS 2006), 30 April, 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 2006 IEEE International Test Conference, 2006
Proceedings of the 7th International Symposium on Quality of Electronic Design (ISQED 2006), 2006
Proceedings of the 15th Asian Test Symposium, 2006
Proceedings of the 15th Asian Test Symposium, 2006
2005
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
Proceedings of the Proceedings 2005 IEEE International Test Conference, 2005
2004
Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004
Proceedings of the 22nd IEEE International Conference on Computer Design: VLSI in Computers & Processors (ICCD 2004), 2004
Proceedings of the 13th Asian Test Symposium (ATS 2004), 2004
2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the 21st International Conference on Computer Design (ICCD 2003), 2003
2002
Proceedings of the Proceedings IEEE International Test Conference 2002, 2002
2000
IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2000
1997
Proceedings of the Proceedings IEEE International Test Conference 1997, 1997
Proceedings of the 34st Conference on Design Automation, 1997