Kuen-Shiuan Tian

According to our database, Kuen-Shiuan Tian authored at least 1 paper in 2009.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2009

Effect of NDD dosage on hot-carrier reliability in DMOS transistors.

Jone F. Chen, Kuen-Shiuan Tian, Shiang-Yu Chen, Kuo-Ming Wu, C. M. Liu

Proceedings of the 10th International Symposium on Quality of Electronic Design (ISQED 2009), 2009