Kuan-Ying Chiang
According to our database1,
Kuan-Ying Chiang
authored at least 2 papers
in 2015.
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Bibliography
2015
Proceedings of the VLSI Design, Automation and Test, 2015
Fault Simulation and Test Pattern Generation for Cross-gate Defects in FinFET Circuits.
Proceedings of the 24th IEEE Asian Test Symposium, 2015