Kranthi K. Pinjala
According to our database1,
Kranthi K. Pinjala
authored at least 2 papers
in 2003.
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Bibliography
2003
Proceedings of the Proceedings 2003 International Test Conference (ITC 2003), Breaking Test Interface Bottlenecks, 28 September, 2003
Proceedings of the 18th IEEE International Symposium on Defect and Fault-Tolerance in VLSI Systems (DFT 2003), 2003