Kouhei Ohtani

According to our database, Kouhei Ohtani authored at least 2 papers between 2003 and 2017.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2017

A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume.

Kouhei Ohtani, Naho Osato, Masaki Hashizume, Hiroyuki Yotsuyanagi, Shyue-Kung Lu

Proceedings of the 17th International Symposium on Communications and Information Technologies, 2017

2003

A Method of Test Generation fo Path Delay Faults Using Stuck-at Fault Test Generation Algorithms.

Satoshi Ohtake, Kouhei Ohtani, Hideo Fujiwara

Proceedings of the 2003 Design, 2003