Konstantin O. Petrosyants

According to our database, Konstantin O. Petrosyants authored at least 19 papers between 2011 and 2021.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of five.

2021

SPICE Compact BJT, MOSFET, and JFET Models for ICs Simulation in the Wide Temperature Range (From -200 °C to +300 °C).

Konstantin O. Petrosyants, Lev M. Sambursky, Maxim V. Kozhukhov, Mamed R. Ismail-Zade, Igor A. Kharitonov, Bo Li

IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2021

2019

Radiation- and Temperature-Induced Fault Modeling and Simulation in BiCMOS LSI's Components using RAD-THERM TCAD Subsystem.

Konstantin O. Petrosyants, Maxim V. Kozhukhov, Dmitry Popov

Proceedings of the 22nd IEEE International Symposium on Design and Diagnostics of Electronic Circuits & Systems, 2019

2018

Compact SPICE Models of the Standard Layout Fragments in LSI Interconnections.

Konstantin O. Petrosyants, N. I. Ryabov, E. I. Batarueva

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

SPICE Simulation of Total Dose and Aging Effects in MOSFET Circuits.

Konstantin O. Petrosyants, Igor A. Kharitonov

Proceedings of the 2018 IEEE East-West Design & Test Symposium, 2018

2017

Electrical characterization and reliability of submicron SOI CMOS technology in the extended temperature range (to 300 °C).

Konstantin O. Petrosyants, Igor A. Kharitonov, Sergey V. Lebedev, Lev M. Sambursky, Sergey O. Safonov, Veniamin G. Stakhin

Microelectron. Reliab., 2017

Radiation-Induced Fault Simulation of SOI/SOS CMOS LSI's Using Universal Rad-SPICE MOSFET Model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

J. Electron. Test., 2017

Generalized test automation method for MOSFET's including characteristics measurements and model parameters extraction for aero-space applications.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Mamed R. Ismail-Zade

Proceedings of the 2017 IEEE East-West Design & Test Symposium, 2017

2016

Fault simulation in radiation-hardened SOI CMOS VLSIs using universal compact MOSFET model.

Konstantin O. Petrosyants, Lev M. Sambursky, Igor A. Kharitonov, Boris G. Lvov

Proceedings of the 17th Latin-American Test Symposium, 2016

2014

The system of microelectronics education for aerospace industry based on "university-enterprise" link.

A. N. Tikhonov, Boris G. Lvov, Konstantin O. Petrosyants, Saygid U. Uvaysov, Igor A. Kharitonov, S. V. Balakin, A. N. Chetyrkin, V. N. Krutikov

Proceedings of the 10th European Workshop on Microelectronics Education (EWME), 2014

Analysis and Simulation of temperature-current rise in modern PCB traces.

Konstantin O. Petrosyants, Artur Kortunov, Igor A. Kharitonov, Anton Popov, Natalya Gomanilova, Nikita I. Rjabov

Proceedings of the 2014 East-West Design & Test Symposium, 2014

SPICE model parameters extraction taking into account the ionizing radiation effects.

Konstantin O. Petrosyants, Maxim V. Kozhukhov

Proceedings of the 2014 East-West Design & Test Symposium, 2014

2013

Logi-thermal analysis of digital circuits using mixed-signal simulator Questa ADMS.

Konstantin O. Petrosyants, Nikita I. Rjabov

Proceedings of the East-West Design & Test Symposium, 2013

Simulation of total dose influence on analog-digital SOI/SOS CMOS circuits with EKV-RAD macromodel.

Konstantin O. Petrosyants, Igor A. Kharitonov, Lev M. Sambursky, V. N. Bogatyrev, Z. M. Povarnitcyna, E. S. Drozdenko

Proceedings of the East-West Design & Test Symposium, 2013

Coupled TCAD-SPICE simulation of parasitic BJT effect on SOI CMOS SRAM SEU.

Konstantin O. Petrosyants, Igor A. Kharitonov, D. A. Popov

Proceedings of the East-West Design & Test Symposium, 2013

New version of automated electro-thermal analysis in Mentor Graphics PCB Design System.

Konstantin O. Petrosyants, P. A. Kozynko, Igor A. Kharitonov, A. V. Sidorov, Y. N. Chichkanov

Proceedings of the East-West Design & Test Symposium, 2013

Account for Radiation Effects in Signal Integrity Analysis of PCB Digital Systems.

Konstantin O. Petrosyants, Igor A. Kharitonov

Proceedings of the 2013 Euromicro Conference on Digital System Design, 2013

2011

Si BJT and SiGe HBT performance modeling after neutron radiation exposure.

Konstantin O. Petrosyants, Eric Vologdin, Dmitry Smirnov, Rostislav Torgovnikov, Maxim V. Kozhukhov

Proceedings of the 9th East-West Design & Test Symposium, 2011

Thermal analysis of the ball grid array packages.

Konstantin O. Petrosyants, Nikita I. Rjabov

Proceedings of the 9th East-West Design & Test Symposium, 2011

TCAD-SPICE simulation of MOSFET switch delay time for different CMOS technologies.

Konstantin O. Petrosyants, E. V. Orekhov, D. A. Popov, Igor A. Kharitonov, Lev M. Sambursky, A. P. Yatmanov, A. V. Voevodin, A. N. Mansurov

Proceedings of the 9th East-West Design & Test Symposium, 2011