Kok Tong Tan

According to our database, Kok Tong Tan authored at least 3 papers between 2004 and 2006.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2006

Development of highly accelerated electromigration test.

Cher Ming Tan, Wei Li, Kok Tong Tan, Frankie Low

Microelectron. Reliab., 2006

2005

Effect of vacuum break after the barrier layer deposition on the electromigration performance of aluminum based line interconnects.

Cher Ming Tan, Arijit Roy, Kok Tong Tan, Derek Sim Kwang Ye, Frankie Low

Microelectron. Reliab., 2005

2004

Reliability Improvement in Al Metallization: A Combination of Statistical Prediction and Failure Analytical Methodology.

Guan Zhang, Cher Ming Tan, Kok Tong Tan, Derek Sim Kwang Ye, W. Y. Zhang

Microelectron. Reliab., 2004