Koji Nakamae

According to our database, Koji Nakamae authored at least 23 papers between 1996 and 2022.

Collaborative distances:

• Dijkstra number of five.
• Erdős number of four.

2022

Accurate measurement of charge density in nanoscale particles using an aperture optimization of Fourier based phase reconstruction.

Takuma Okada, Yoshihiro Midoh, Koji Nakamae, Noriyuki Miura

Proceedings of the Computational Imaging XX, online, January 15-26, 2022, 2022

2018

Simulation-based evaluation of probing attacks to arbiter PUFs using a time-resolved emission microscope.

Katsuyoshi Miura, Atsuki Seko, Koji Nakamae

Microelectron. Reliab., 2018

2017

NBTI/PBTI tolerant arbiter PUF circuits.

Koyo Suzuki, Katsuyoshi Miura, Koji Nakamae

Proceedings of the 23rd IEEE International Symposium on On-Line Testing and Robust System Design, 2017

2016

A quantum watermarking scheme using simple and small-scale quantum circuits.

S. Miyake, Koji Nakamae

Quantum Inf. Process., 2016

2015

Thermoreflectance mapping observation of Power MOSFET under UIS avalanche breakdown condition.

Koichi Endo, Kenji Norimatsu, Tomonori Nakamura, Takashi Setoya, Koji Nakamae

Microelectron. Reliab., 2015

2011

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

Microelectron. Reliab., 2011

2009

Laser THz emission microscope as a novel tool for LSI failure analysis.

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa

Microelectron. Reliab., 2009

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.

Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae

IEICE Trans. Electron., 2009

2007

Estimation of electron probe profile from SEM image through wavelet multiresolution analysis for inline SEM inspection.

Koji Nakamae, Masaki Chikahisa, Hiromu Fujioka

Image Vis. Comput., 2007

Computer-assisted lesion detection system for stomach screening using stomach shape and appearance models.

Yoshihiro Midoh, M. Nakamura, M. Takashima, Koji Nakamae, Hiromu Fujioka

Proceedings of the Medical Imaging 2007: Computer-Aided Diagnosis, San Diego, 2007

2006

Image deblurring by the combined use of a super-resolution technique and inverse filtering.

Yasuyuki Yamada, Koji Nakamae, Hiromu Fujioka

Proceedings of the Computational Imaging IV, San Jose, 2006

2003

A low energy FIB processing, repair, and test system.

Katsuyoshi Miura, Tomoyuki Kobatake, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2003

Cost Optimum Embedded DRAM Design by Yield Analysis.

Youhei Zenda, Koji Nakamae, Hiromu Fujioka

Proceedings of the 11th IEEE International Workshop on Memory Technology, 2003

2002

CAD navigation system, for backside waveform probing of CMOS devices.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2002

2001

Development of an EB/FIB Integrated Test System.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Microelectron. Reliab., 2001

2000

EB tester fault localization algorithm for combinational circuits by utilizing fault simulation and test pattern sequence for EB tester.

Koji Nakamae, Takashi Ishimura, Hiromu Fujioka

Syst. Comput. Jpn., 2000

1999

Intelligent EB Test System for Automatic VLSI Fault Tracing.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1998

Knowledge-based circuit recognition from standard-cell design CMOS VLSI optical microscope images.

Koji Nakamae, Shinji Yokoyama, Atsushi Onishi, Hiromu Fujioka

Syst. Comput. Jpn., 1998

1997

Hierarchical VLSI Fault Tracing by Successive Circuit Extraction from CAD Layout Data in the CAD-Linked EB Test System.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

J. Electron. Test., 1997

Automatic EB Fault Tracing System by Successive Circuit Extraction from VLSI CAD Layout Data.

Katsuyoshi Miura, Kohei Nakata, Koji Nakamae, Hiromu Fujioka

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997

Hierarchical fault tracing for VLSI sequential circuits from CAD layout data in the CAD-linked EB test system.

Katsuyoshi Miura, Koji Nakamae, Hiromu Fujioka

Proceedings of the ASP-DAC '97 Asia and South Pacific Design Automation Conference, 1997

1996

How ATE Planning Affects LSI Manufacturing Cost.

Koji Nakamae, Homare Sakamoto, Hiromu Fujioka

IEEE Des. Test Comput., 1996

Effects of Multi-Product, Small-Sized Production of LSIs Packaged in Various Packages on the Final Test Process Efficiency and Cost.

Hiromu Fujioka, Koji Nakamae, Akio Higashi

Proceedings of the Proceedings IEEE International Test Conference 1996, 1996