Koji Banno

According to our database, Koji Banno authored at least 1 paper in 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2014

A volume diagnosis method for identifying systematic faults in lower-yield wafer occurring during mass production.

Tsutomu Ishida, Izumi Nitta, Koji Banno, Yuzi Kanazawa

Proceedings of the 19th Asia and South Pacific Design Automation Conference, 2014