Kohichi Yokoyama

According to our database, Kohichi Yokoyama authored at least 3 papers between 2012 and 2014.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of six.

2014

Case studies of defect localization based on software-based fault diagnosis in comparison with PEMS/OBIRCH analysis.

Takuya Naoe, Taketoshi Mizobe, Kohichi Yokoyama

Microelectron. Reliab., 2014

2013

Local damage free Si substrate ultra thinning for backside emission spectral analysis using OBPF for LSI failure mode detection.

Takuya Naoe, Tamao Ikeuchi, Chie Moritni, Hirohiko Endoh, Kohichi Yokoyama

Microelectron. Reliab., 2013

2012

Via high resistance failure analysis of LSI devices induced by multiple factors related to process and design.

Takuya Naoe, Hirotaka Komoda, Tamao Ikeuchi, Kohichi Yokoyama

Microelectron. Reliab., 2012