Klinsmann J. Coelho Silva Meneses

Linda Wu

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2023

2022

Image Degradation due to Interacting Adjacent Hot Pixels.

[BibT_eX]

[DOI]

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2022

2021

Dependence of SEUs in Digital Cameras on Pixel size and Elevation.

[BibT_eX]

[DOI]

Simone Neufeld

Proceedings of the 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2021

2020

Using digital imagers to characterize the dependence of energy and area distributions of SEUs on elevation.

[BibT_eX]

[DOI]

Ruoyi Zhao

Proceedings of the IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2020

2019

Image degradation from hot pixel defects with pixel size shrinkage.

[BibT_eX]

[DOI]

Proceedings of the Image Sensors and Imaging Systems 2019, 2019

Detecting SEUs in Noisy Digital Imagers with small pixels.

[BibT_eX]

[DOI]

Proceedings of the 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2019

2018

Exploring Hot Pixel Characteristics for 7 to 1.3 micron Pixels.

[BibT_eX]

[DOI]

Parham Purbakht

Proceedings of the Image Sensors and Imaging Systems 2018, 2018

Analysis of Single Event Upsets Based on Digital Cameras with Very Small Pixels.

[BibT_eX]

[DOI]

Proceedings of the 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, 2018

2016

Increases in Hot Pixel Development Rates for Small Digital Pixel Sizes.

[BibT_eX]

[DOI]

Rahul Thomas

Tommy Q. Yang

Proceedings of the Image Sensors and Imaging Systems 2016, 2016

2015

Single Event Upsets and Hot Pixels in digital imagers.

[BibT_eX]

[DOI]

Rahul Thomas

Tommy Q. Yang