Kiyoshi Nikawa

According to our database, Kiyoshi Nikawa authored at least 7 papers between 1997 and 2013.

Collaborative distances:

• Dijkstra number of six.
• Erdős number of five.

2013

Observation of impurity diffusion defect in IGBT using a laser terahertz emission microscope technique.

Yasunori Goto, Toru Matsumoto, Kiyoshi Nikawa

Microelectron. Reliab., 2013

2011

The combinational or selective usage of the laser SQUID microscope, the non-bias laser terahertz emission microscope, and fault simulations in non-electrical-contact fault localization.

Kiyoshi Nikawa, Masatsugu Yamashita, Toru Matsumoto, Katsuyoshi Miura, Yoshihiro Midoh, Koji Nakamae

Microelectron. Reliab., 2011

2009

Laser THz emission microscope as a novel tool for LSI failure analysis.

Masatsugu Yamashita, Chiko Otani, Sunmi Kim, Hironaru Murakami, Masayoshi Tonouchi, Toru Matsumoto, Yoshihiro Midoh, Katsuyoshi Miura, Koji Nakamae, Kiyoshi Nikawa

Microelectron. Reliab., 2009

New Approach of Laser-SQUID Microscopy to LSI Failure Analysis.

Kiyoshi Nikawa, Shoji Inoue, Tatsuoki Nagaishi, Toru Matsumoto, Katsuyoshi Miura, Koji Nakamae

IEICE Trans. Electron., 2009

2004

How long can we succeed using the OBIRCH and its derivatives?

Kiyoshi Nikawa

Proceedings of the Proceedings 2004 International Test Conference (ITC 2004), 2004

1999

Failure Analysis Case Studies Using the IR-OBIRCH (Infrared Optical Beam Induced Resistance CHange) Method.

Kiyoshi Nikawa, Shoji Inoue, Kazuyuki Morimoto, Shinya Sone

Proceedings of the 8th Asian Test Symposium (ATS '99), 1999

1997

New Capabilities of OBIRCH Method for Fault Localization and Defect Detection.

Kiyoshi Nikawa, Shoji Inoue

Proceedings of the 6th Asian Test Symposium (ATS '97), 17-18 November 1997, 1997